Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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7/00
Measuring arrangements characterised by the use of electric or magnetic techniques
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G01B7/28
for measuring contours or curvatures
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G01B7/281
for measuring contour or curvature along an axis, e.g. axial curvature of a pipeline or along a series of feeder rollers
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