Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
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60/00
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
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G01Q60/02
Multiple-type SPM, i.e. involving more than one SPM techniques
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G01Q60/06
SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
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