G01R33/14

Systems, methods, and apparatus for detecting ferromagnetic foreign objects in a predetermined space

An apparatus for detecting a presence of an object includes an inductive sensing coil that is configurable to generate a first magnetic field. The inductive sensing coil is configured to have an electrical characteristic that is detectable when generating the first magnetic field. The electrical characteristic is configured to vary as a function of a second time-varying magnetic field simultaneously applied to the object. The apparatus comprises a controller configured to detect a change in the electrical characteristic and determine a presence of the object based on the detected change in the electrical characteristic. The electrical characteristic comprises one or more of an equivalent resistance, an equivalent inductance, an equivalent impedance, and an impulse response of the inductive sensing coil. The object comprises one or more of a ferromagnetic object, a metallic film and a metallic foil.

ELECTROMECHANICAL SENSOR AND A METHOD OF SENSING AN OBJECT OR A TACTILE INPUT USING THE SENSOR
20220276038 · 2022-09-01 ·

An electromechanical sensor and a method of sensing an object or a tactile input using the sensor. The sensor includes: a base provided with a magnetic sensor arranged to detect a change in magnetic flux at the position of the magnetic sensor; a flexible film adjacent to the magnetic sensor; and a magnetic element provided on the flexible film; wherein the magnetic element is arranged to move relative to the magnetic sensor when the flexible film is reversibly deformed by an external force applied to the flexible film.

Test and measurement instrument for determining maximum flux density

A test and measurement instrument, including at least one port configured to receive a signal from a device under test (DUT), the signal including a current signal acquired across a magnetic core of the DUT and a voltage signal acquired across the magnetic core of the DUT, and one or more processors. The one or more processors are configured to determine a hysteresis loop based on the current signal and the voltage signal, determine a magnetic flux of the magnetic core based on the voltage signal and the current signal for a number of sample points for each cycle, and determine a maximum magnetic flux for all cycles and a hysteresis loop cycle that corresponds to the maximum magnetic flux. A display configured to display at least one of the hysteresis loop, the signal received from the DUT, and the hysteresis loop cycle that corresponds to the maximum magnetic flux.

Test and measurement instrument for determining maximum flux density

A test and measurement instrument, including at least one port configured to receive a signal from a device under test (DUT), the signal including a current signal acquired across a magnetic core of the DUT and a voltage signal acquired across the magnetic core of the DUT, and one or more processors. The one or more processors are configured to determine a hysteresis loop based on the current signal and the voltage signal, determine a magnetic flux of the magnetic core based on the voltage signal and the current signal for a number of sample points for each cycle, and determine a maximum magnetic flux for all cycles and a hysteresis loop cycle that corresponds to the maximum magnetic flux. A display configured to display at least one of the hysteresis loop, the signal received from the DUT, and the hysteresis loop cycle that corresponds to the maximum magnetic flux.

Magnetic sensor bridge using dual free layer

The present disclosure generally relates to sensor device, such as a magnetic sensor bridge, that utilizes a dual free layer (DFL) structure. The device includes a plurality of resistors that each includes the same DFL structure. Adjacent the DFL structure is a magnetic structure that can include a permanent magnet, an antiferromagnetic (AFM) layer having a synthetic AFM (SAF) structure thereon, a permanent magnetic having a SAF structure thereon, or an AFM layer having a ferromagnetic layer thereon. The DFL structures are aligned with different layers of the magnetic structures to differentiate the resistors. The different alignment and/or different magnetic structures result in a decrease in production time due to reduced complexity and, thus, reduces costs.

TENSION MEASURING METHOD

A tension measuring method installs a reel having a cylindrical coil forming part on a cable to be measured, forms a coil by winding a conductor around the coil forming part, measures a magnetic hysteresis loop of the cable by supplying a current to the coil to generate a magnetic field, and computes a tension of the cable using a parameter determined from the hysteresis loop. A magnetic field sensor and a magnetic flux sensor are provided inside a through hole in the coil forming part, and the cable is positioned inside the through hole. The magnetic field is varied so that the hysteresis loop includes a near-saturation magnetization region, to measure the hysteresis loop using the sensors. The parameter is selected from a magnetic flux or a magnetic flux density, a remanent magnetization, a coercivity, a magnetic permeability, and a hysteresis loss in the near-saturation magnetization region.

TENSION MEASURING METHOD

A tension measuring method installs a reel having a cylindrical coil forming part on a cable to be measured, forms a coil by winding a conductor around the coil forming part, measures a magnetic hysteresis loop of the cable by supplying a current to the coil to generate a magnetic field, and computes a tension of the cable using a parameter determined from the hysteresis loop. A magnetic field sensor and a magnetic flux sensor are provided inside a through hole in the coil forming part, and the cable is positioned inside the through hole. The magnetic field is varied so that the hysteresis loop includes a near-saturation magnetization region, to measure the hysteresis loop using the sensors. The parameter is selected from a magnetic flux or a magnetic flux density, a remanent magnetization, a coercivity, a magnetic permeability, and a hysteresis loss in the near-saturation magnetization region.

METHOD FOR EVALUATING ULTIMATE DEMAGNETIZATION TEMPERATURE OF MAGNET
20210333338 · 2021-10-28 ·

A method for evaluating ultimate demagnetization temperature of magnet includes displaying a workspace interface. The workspace interface at least includes an operation area, a model view displaying area, and a demagnetization curve displaying area. A geometric model view of a geometric model file to be solved is displayed in the model view displaying area. Information input is received through the operation area and the model view displaying area, and performance parameters and designing variables to be solved and formulas are imported accordingly. Through calculating, a demagnetization curve with post-treatment for the magnet is obtained and displayed in the demagnetization curve displaying area.

SYSTEM FOR EXCITING IRON CORE IN ELECTRIC DEVICE, METHOD FOR EXCITING IRON CORE IN ELECTRIC DEVICE, PROGRAM, AND MODULATION OPERATION-SETTING DEVICE FOR INVERTER POWER SUPPLY
20210273595 · 2021-09-02 · ·

The iron loss of an iron core excited by an inverter power supply is reduced. A modulation operation-setting device 1430 for the inverter power supply controls a maximum value Hmax and a minimum value Hmin of a field intensity H in at least one minor loop such that the loss (iron loss, copper loss, and switching loss) of the entire system is less than the loss of the entire system when an electric device is operated with a target waveform (excluding harmonics).

Systems and Methods for MOKE Metrology with Consistent MRAM Die Orientation
20210025951 · 2021-01-28 ·

A metrology tool includes a magnet to generate a magnetic field and a stage system to position a plurality of MRAM dies on an MRAM wafer in the magnetic field. The stage system includes a chuck on which to mount the MRAM wafer. The metrology tool further includes optics to provide a laser beam and direct the laser beam to be incident upon respective MRAM dies positioned in the magnetic field. The metrology tool additionally includes a detector to receive the laser beam as reflected by the respective MRAM dies and to measure rotation of the polarization of the reflected laser beam. The metrology tool is configurable to provide each MRAM die on the MRAM wafer with a common orientation with respect to the polarization of the laser beam.