G01R33/14

Method for detecting arrangement disorder of fibers in conductive composite material, and device for detecting arrangement disorder of fibers in conductive composite material

Provided are a method and device for detecting arrangement disorder of fibers in a conductive composite material. A coil (7) is disposed at a position at which the coil (7) faces the conductive composite material, and thereby a current can be applied to the conductive composite material. Thus, work or the like for attaching electrodes to the conductive composite material is not required. As a result, the arrangement disorder of the fibers in the conductive composite material can easily be detected. A method for detecting meandering of fibers in a conductive composite material includes a step of disposing a magnetic field sensor (8) at a position at which the magnetic field sensor (8) faces a surface (Sa) of the conductive composite material such that a direction (D) of a magnetosensitive axis is horizontal with the surface (Sa) and is parallel to coil faces (7e). Therefore, the magnetic field sensor (8) measures a magnetic field, and thereby a portion at which the arrangement disorder of the fibers in the conductive composite material is present can be detected.

Test and Measurement Instrument with a Hysteresis Loop Mask

A test and measurement instrument, comprising at least one port configured to receive a signal from a device under test; a user interface configured to receive a user input, the user input indicating magnetic properties of a magnetic material of the device under test, and one or more processors. The one or more processors are configured to generate a hysteresis loop mask based on the magnetic properties of the magnetic material, determine whether the signal received from the device under test violates the hysteresis loop mask, and generate an alert when the signal received from the device under test violates the hysteresis loop mask. The test and measurement instrument may also include a display configured to display the hysteresis loop mask, the signal received from the device under test, and/or the alert.

Test and Measurement Instrument with a Hysteresis Loop Mask

A test and measurement instrument, comprising at least one port configured to receive a signal from a device under test; a user interface configured to receive a user input, the user input indicating magnetic properties of a magnetic material of the device under test, and one or more processors. The one or more processors are configured to generate a hysteresis loop mask based on the magnetic properties of the magnetic material, determine whether the signal received from the device under test violates the hysteresis loop mask, and generate an alert when the signal received from the device under test violates the hysteresis loop mask. The test and measurement instrument may also include a display configured to display the hysteresis loop mask, the signal received from the device under test, and/or the alert.

Built in test of remote isolation

Embodiments herein relate to a system and method for detecting a degraded isolation impedance in a positively sourced remote load. The system includes a remote load driven by a direct current (DC) source, and a controller operably connected to the remote load having a positive sourcing driver interface with a dedicated return having the DC source on an output leg and a dedicated return leg. The positive sourcing driver also including a switching device configured controllably connect a DC voltage supply to the output leg of the DC voltage source, a first impedance operably connected between the output leg and ground, a second impedance operably connected between the dedicated return leg and a negative voltage supply, and a clamping and limiting device operably connected in series between the dedicated return leg and ground, the clamping device configured to limit a positive voltage on the return leg.

System and method for dual-kernel image reconstruction

A method and imaging system is provided that can control a magnetic gradient system and an RF system of an MRI system according to a calibration pulse sequence to acquire positive readout gradient (RO+) data and negative readout gradient (RO) data. The RO+ data and the RQ data are assembled to form complete image data sets for the RO+ data and the RQ data and the RO+ data and the RO data are combined to generate the calibration data that is ghost-corrected, substantially free of ghost artifacts, or having reduced ghost artifacts compared to traditionally-acquired calibration data. Reconstruction coefficients are derived from the calibration data. The magnetic gradient system and the RF system are controlled according to an imaging pulse sequence to acquire image data and the image data is reconstructed into an image of the subject using the reconstruction coefficients.

Measurement method for B-H curve of magnetic material based on magnetic-inductance
11965942 · 2024-04-23 · ·

A measurement apparatus includes an Epstein frame, an alternating power supply, a power analyzer, and an oscilloscope. Electromagnetic coupling modeling on an Epstein frame is performed based on a vector model of a magnetic circuit, where an iron core of the Epstein frame is formed by laminating a silicon steel sheet to be measured, and an excitation coil and a detection coil with the same turns number are wound around the iron core. The measurement process is to first obtain a reference B-H curve that only considers a nonlinear reluctance of the iron core, and then to derive a B-H curve considering an eddy current effect in a magnetic field at any frequency from the reference B-H curve. The method, applicable to a measurement for B-H curves at middle and high frequencies, may obtain much higher accuracy.

Device and method for measuring magnetism of permanent magnet material at high temperature

A device for measuring magnetism of a permanent magnet material at a high temperature includes a laser device, a power controller, a light beam controller, a temperature controller, a magnetism measurement unit, temperature sensors, and electromagnet pole heads. The electromagnet pole heads are divided into an upper piece and a lower piece for clamping upper and lower surfaces of a sample. Heat absorbing sheets are respectively fixed on front and rear surfaces of the sample. Temperatures of the heat absorbing sheets are measured by the temperature sensors. The sample is heated by laser, and the temperature controller is used to adjust a ratio of light beams of the power controller and the light beam controller irradiating the heat absorbing sheets on the front and rear surfaces of the sample, thus adjusting the temperatures of the heat absorbing sheets. The magnetism of the sample is measured using the magnetism measurement unit.

Systems and methods for vector hysteresis analysis
10345398 · 2019-07-09 · ·

Systems and methods are provided for analyzing magnetic hysteresis. A reversible component associated with an applied magnetic field is determined for establishing a series-distributed model. One or more hysteresis loops are generated for analyzing magnetic hysteresis of a magnetic material.

Systems and methods for vector hysteresis analysis
10345398 · 2019-07-09 · ·

Systems and methods are provided for analyzing magnetic hysteresis. A reversible component associated with an applied magnetic field is determined for establishing a series-distributed model. One or more hysteresis loops are generated for analyzing magnetic hysteresis of a magnetic material.

METHOD AND APPARATUS FOR MAPPING THE OPEN CIRCUIT DEMAGNETISATION CURVE OF A SAMPLE OF MAGNETIC MATERIAL TO A CLOSED CIRCUIT DEMAGNETISATION CURVE
20240210499 · 2024-06-27 ·

A method and apparatus for accurately mapping the closed magnetic circuit demagnetisation curve to and from a open magnetic circuit demagnetisation curve. The method utilises open circuit data from a pulsed field magnetometer (PFM) and computer modelling of both the PFM (open circuit) and permeameter (closed circuit) apparatus. This method is more accurate than previous methods and can calculate the closed circuit curve within the precision of both the PFM and the permeameter apparatus.