One example of an inspection system includes a laser, a magnification changer, and a first camera. The laser projects a line onto a wafer to be inspected. The magnification changer includes a plurality of selectable lenses of different magnification. The first camera images the line projected onto the wafer and outputs three-dimensional line data indicating the height of features of the wafer. Each lens of the magnification changer provides the same nominal focal plane position of the first camera with respect to the wafer.

A wired-rope measuring device, provided with two cameras 1, 2 that shoot one or no less than two wired ropes 8 from different directions and an analyzing device 5 that analyzes image data that is an image shot by the two cameras 1, 2, wherein the analyzing device 5 applies the principle of triangulation by a stereo method to the image data to seek a center coordinate P.sub.0 of the wired rope 8 relative to the cameras 1, 2 and volumetric anamorphosis is corrected when calculating a diameter D of the wired rope 8 based on the center coordinate P.sub.0 of the wired rope 8.

A process abnormality detection system for a three-dimensional additive manufacturing device which performs additive modeling by emitting a beam to a powder bed determines that a laying abnormality of the powder bed is occurring if at least one of a first condition that an average height of the powder bed from a reference position is out of a first predetermined range or a second condition that a height variation of the powder bed is out of a second predetermined range is satisfied, on the basis of a detection result of a shape measurement sensor.

A system for creating a near-spherical point cloud of RGBD data includes one or more sensing units for providing depth data, each sensing unit having a stereo pair of sensors fitted with the wide-angle lens from which a one-dimensional line of pixels is read, and one or more lasers for illuminating the single line of pixels, the sensing units mounted on a spinning platform. The spinning platform is mounted on the base having a plurality of cameras mounted therein for providing 360-degree RGB data.

A method and device for inspection of a rotating asset is disclosed. In one embodiment, the inspection device can include textured pattern projection system for projecting a textured pattern onto an object surface to provide additional surface details to improve stereoscopic image matching. In another embodiment, the inspection device can be configured to save selected images a rotating object when the object is located in a selected or trigger position in different illumination modes. The saved selected images can be transmitted and stored in a cloud-based server and analyzed in an automated fashion.

A computer numerical control (CNC) machining center is provided. The CNC machining center includes a spindle that receives a cutting tool. A work surface is operably arranged adjacent the spindle. A non-contact three-dimensional (3D) measurement device is operably coupled to the tool mount, the 3D measurement device including a projector and at least one device camera, the at least one camera being arranged to receive light from the light source that is reflected off of a surface. A plurality of targets is provided with at least one of the targets coupled to the 3D measurement device. At least two photogrammetry cameras are provided having a orientation and a field of view to acquire images of the targets. A controller is coupled for communication to the 3D measurement device and the at least two cameras, the controller determining the position of the 3D measurement device within the machining center during operation.

Provided is a structured light projector including a light source configured to emit light, and a nanostructure array configured to form a dot pattern based on the light emitted by the light source, the nanostructure array including a plurality of super cells each respectively including a plurality of nanostructures, wherein each of the plurality of super cells includes a first sub cell that includes a plurality of first nanostructures having a first shape distribution and a second sub cell that includes a plurality of second nanostructures having a second shape distribution.

A method of 3D measurement is performed using a first camera and a second camera located at different distances from the projector. The method includes projecting a known projection pattern that includes at least two non-crossing lines to form a first band and a second band on a surface of an object. The method includes recording first and second images of the object using the first and second cameras, respectively. The method includes determining a first longitudinal coordinate of a first point within the first band and a first vertical coordinate of the first point within the first band; determining a second longitudinal coordinate of the first point within the first band; and determining a second vertical coordinate of the first point within the first band. The method includes determining a final vertical coordinate of the first point by comparing the first longitudinal coordinate to the second longitudinal coordinate.

A method for three-dimensional imaging includes emitting an output light with a structured light illuminator in a structured light pattern, receiving a trigger command, changing a field of illumination of the illuminator, and changing a field of view of an imaging sensor. The field of view and the field of illumination are linked, such that the field of view of the imaging sensor is the same as the field of illumination of the illuminator at a short throw field of view and a long throw field of view. The method further includes detecting a reflected light with the imaging sensor and measuring a depth value by calculating a distortion of the structured light pattern.

Disclosed embodiments include methods and systems for utilizing a structured projection pattern to perform depth detection. In some instances, the structured projection pattern forms a dot pattern, which is projected by an infrared (IR) illuminator, wherein the dot pattern includes a replicated sub-pattern having a predefined height and width. The sub-pattern is replicated in at least one direction such that the dot pattern comprises a plurality of replicated sub-patterns that are adjacently positioned.