Patent classifications
G01B11/2545
MEASUREMENT DEVICE
A measurement device includes: an optical system that splits incident light into two lights to emit one light as measurement light to a measurement object and the other light as reference light to a reference surface, and recombines the two lights to emit combined light; a light emitter that emits light entering the optical system; an imaging system that takes an image of output light emitted from the optical system; and a processor that executes measurement with regard to a predetermined measurement area of the measurement object, based on an interference fringe image taken by the imaging system, wherein the processor: obtains complex amplitude data at a predetermined position in an optical axis direction at predetermined intervals in at least a predetermined range in the optical axis direction, with regard to a specific area set in advance in the measurement area based on the interference fringe image.
RECOGNITION OF CHANGES IN A DETECTION ZONE
A method of recognizing changes in a detection zone is provided in which three-dimensional image data of the detection zone are detected and evaluated to recognize changes with reference to three-dimensional reference image data. The detection zone is divided into cells in this process. Reference limit values at which heights objects are recognized are determined in a teaching phase. In an operating phase, a maximum value and/or a minimal value of the heights of currently recognized objects is/are determined from the respective detected image data and a change is recognized on a deviation with respect to the reference limit values.
HIGH CONTRAST STRUCTURED LIGHT PATTERNS FOR QIS SENSORS
A structured-light pattern for a structured-light system includes a base light pattern that includes a row of a plurality of sub-patterns extending in a first direction. Each sub-pattern is adjacent to at least one other sub-pattern, and each sub-pattern is different from each other sub-pattern. Each sub-pattern includes a first number of portions in a sub-row and a second number of portions in a sub-column. Each sub-row extends in the first direction and each sub-column extends in a second direction that is substantially orthogonal to the first direction. Each portion may be a first-type portion or a second-type portion. A size of a first-type portion is larger in the first direction and in the second direction than a size of a second-type portion in the first direction and in the second direction. In one embodiment, a first-type portion is a black portion and the second-type portion is a white portion.
Three-dimensional sensor system and three-dimensional data acquisition method
A three-dimensional system includes at least one pattern projector, at least two cameras, a two-dimensional image feature extractor, a three-dimensional point-cloud generator, and a three-dimensional point-cloud verifier. The pattern projector is configured to synchronously project at least two linear patterns. The at least two cameras are configured to synchronously capture a two-dimensional image of the scanned object. The two-dimensional image feature extractor is configured to extract a two-dimensional line set of the at least two linear patterns on the surface of the scanned object on the two-dimensional image. The three-dimensional point-cloud generator is configured to generate the candidate three-dimensional point set based on the two-dimensional line set. The three-dimensional point-cloud verifier is configured to select an authentic three-dimensional point set correctly matching with the projection contour lines on the surface of the object from the candidate three-dimensional point set.
THREE-DIMENSIONAL SCANNER, THREE-DIMENSIONAL SCANNING SYSTEM, AND THREE-DIMENSIONAL RECONSTRUCTION METHOD
The present disclosure relates to a three-dimensional (3D) scanner, a 3D system, and a 3D reconstruction method. An emitting device in the three-dimensional is configured to emit preset light rays, the preset light rays including at least two types of monochromatic light rays; a collimating device is configured to perform uniform illumination processing on the preset light rays; a pattern forming device is configured to project the preset light rays undergone uniform illumination processing in a form of a structured light pattern; an optical path adjustment device is configured to change a transmission path of the structured light pattern so as to project the structured light pattern to a target object, and project the structured light pattern modulated by the target object to the image acquisition device; and an image acquisition device is configured to perform spectral splitting on the structured light pattern modulated by the target object, and acquire multiple split structured light patterns through different cameras for 3D reconstruction. Therefore, the reduction of hardware cost required by a 3D reconstruction method is achieved; and moreover, 3D reconstruction can be performed only by a 2D image captured in a single instance, so that the reconstruction efficiency of an image is improved to a great extent.
Projection system for directing and monitoring activity in large scale facilities
A first projection device includes a first laser projector and a first measurement system. A second projection device includes a second laser projector and a second measurement system. The first projection device and the second projection device is interconnected with a controller. The controller is programmed with computer aided design data representative of a large scale work area and coordinates electronic interaction between the first projection device and the second projection device. The first projection device projects a first indicia that is detectable by the second measurement system and the second projection device projects a second indicia that is detectable by the first measurement system. The controller is adapted for determining relative position within three-dimensional coordinate system of the first projection device to the second projection device from the first indicia detected by the second measurement system and the second indicia detected by the first measurement system.
Three-dimensional scanner and three-dimensional scanning method
The present application discloses a three-dimensional scanner and a three-dimensional scanning method. The three-dimensional scanner includes: an image projection device, configured to project light onto a target object, wherein the light includes predetermined light projected in the form of a color-coded stripe that is formed by coding stripes of at least two colors; and an image acquisition device, configured to acquire light modulated by the target object so as to obtain at least one stripe image in the case where light is projected onto the target object by the image projection device, wherein the obtained stripe image is taken as a coding image to determine respective stripe sequences and as a reconstruction image to perform three-dimensional reconstruction on the target object.
Measurement method and measurement system
A measurement method includes measuring a normal vector of a measured portion based on a first vector representing a direction from a measured portion to a principal point of a first lens, a second vector representing a direction from the measured portion to a principal point of a second lens, a third vector representing a direction from the measured portion to a principal point of a third lens, a first value representing luminance of the measured portion in a situation in which the first projector projects a fourth image via the first lens, a second value representing the luminance of the measured portion in a situation in which the second projector projects a fifth image via the second lens, and a third value representing the luminance of the measured portion in a situation in which the third projector projects a sixth image via the third lens.
Method and device for the contact-free measurement of surface contours
Method and device for non-contact measuring of surface contours. A sequence of stripe patterns, formed from a plurality of stripes of equal stripe direction are projected on a surface to be measured, wherein the stripe patterns are each aperiodic and have a sinusoidal brightness distribution and wherein, during the projecting of each of the stripe patterns, at least one image of the surface is captured by at least one camera. By the stripe pattern projected on the surface, corresponding points in the image planes of a camera and of a projection device used for projecting, or in the image planes of the cameras, are then identified by maximizing a correlation between sequences of brightness values recorded for each of the points, whereupon spatial coordinates of surface points on the surface are determined via triangulation on the basis of points identified as corresponding.
Three-dimensional shape measurement apparatus
A three-dimensional shape measurement apparatus includes main pattern illumination parts, main image-capturing parts and a control part. The main pattern illumination parts obliquely illuminate grating pattern light in different directions toward a measurement target. The main image-capturing parts obtain a grating pattern image of the measurement target by receiving reflection light of the grating pattern light illuminated from the main pattern illumination parts and obliquely reflected by the measurement target. The control part produces height data of the measurement target using grating pattern images of the measurement target, or produces height data of the measurement target using image positions of plane images for the measurement target and texture information of the measurement target. The control part employs a grating pattern illuminated on the measurement target as the texture information to produce height data of the measurement target. Thus, a three-dimensional shape may be measured more easily and accurately.