Patent classifications
G01B11/2545
ULTRA-HIGH SPATIAL RESOLUTION STRUCTURED LIGHT SCANNER AND APPLICATIONS THEREOF
A structured light three-dimensional scanner (SLS) is described for digitally reconstructing surface topography useful in additive manufacturing (A.M) processes. In an example, the structured light three-dimensional scanner includes a first imaging device having a first lens, a second imaging device having a second lens, and a controller, where the first imaging device and the second imaging device collectively have a field-of-view less than or equal to 5050 mm. The controller is configured to direct the first imaging device and the second imaging device to capture calibration images of a calibration target, the calibration target having a predetermined pattern thereon, calibrate the structured light three-dimensional scanner using the calibration images, direct the first imaging device and the second imaging device to capture images of the object to be scanned, and perform triangulation based on the images captured of the object to generate three-dimensional data of the object.
DEPTH DATA MEASURING HEAD, MEASURING APPARATUS, AND MEASURING METHOD
Disclosed are a depth data measuring head, a measuring device and a measuring method. The measuring head comprises: a projection device for projecting linear light to an imaging area; an image sensor comprising N memory cell sets, each memory cell set exposed in an exposure switch cycle t.sub.e that is phase-shifted by 2/N relative to each other. The projection device completes a single pattern scan within a scanning cycle , which includes multiple repeating subcycles
, in each subcycle
, a projection cycle t.sub.p includes N waveform projection areas with a width of 2/N and light intensity encoded based on the imaging pattern. Therefore, when a pattern scan is completed within the scanning cycle
, each of the N N memory cell sets of the image sensor images a different striped-light pattern, and there is a phase shift of 2/N between the N striped-light patterns. The present invention can realize the acquisition of multiple images of a single linear light scan, greatly improve the synthesis speed of the depth map, and is suitable for capturing a moving target object.
Handheld scanner that transfers data and power over ethernet
A system includes a handheld unit having a light source, an image sensor, one or more first processors, an Ethernet cable, and a frame. The light source projects light onto an object, and the image sensor captures an image of light reflected from the object. One or more first processors are directly coupled to the frame. An accessory device has one or more second processors that receive data extracted from the captured image over the Ethernet cable and, in response, determine three-dimensional (3D) coordinates of points on the object. The accessory device also send electrical power over the Ethernet cable to the handheld unit.
Optical measurement system
The invention relates to a displacement sensor, for example as used in 3D sensors for measuring the three-dimensional shape of an object. A diffraction grating is used to reduce the angle of incidence of measurement light on a light sensor, such as an image sensor, thereby improving the performance of the light sensor. The displacement sensors of the present invention include sensors based on triangulation and coaxial sensors.
INTRAORAL 3D SCANNING SYSTEM USING MIRROR AND STRUCTURED LIGHT PROJECTION WITH MULTIPLE PATTERN FEATURE TYPES
A system comprises an intraoral scanning device and a processor. The intraoral scanning device comprises a wand including a probe, one or more light projectors disposed in the probe and configured to project a structured light pattern, wherein the structured light pattern comprises first pattern features of a first type and second pattern features of a second type, and two or more cameras disposed in the probe and configured to acquire one or more sets of images. The processor is configured to solve a correspondence problem within each set of images such that first points in 3D space are determined based on a captured subset of the first pattern features and a corresponding projected subset of the first pattern features and second points in 3D space are determined based on a captured subset of the second pattern features and a corresponding projected subset of the second pattern features.
Shape measuring device
A shape measuring device includes: a first light radiating unit to radiate first line light and second line light; a first image capturing unit to capture an object; and a measuring unit to measure a shape of the object on a basis of a first image and second images.
Phase unwrapping method based on multi-view constraints of light field and related components
The present disclosure provides a phase unwrapping method based on multi-view constraints of a light field and related components. The method includes: sampling main view phases at different depths in a measurement scene; performing polynomial calibration on a mapping relation from the main view phase to the pixel coordinates of the corresponding points in auxiliary view images; calculating a candidate absolute phase set of each pixel in a main view image; traversing the candidate absolute phase set, calculating an error value between the candidate absolute phase set and wrapped phases of the pixel coordinates of the corresponding points in all the auxiliary view images by utilizing a calibrated mapping relation, and taking a candidate phase corresponding to the minimum error value as an absolute phase of each pixel in the main view image. The present disclosure can stably realize accurate phase unwrapping of the structured light field.
LINE SCANNER HAVING INTEGRATED PROCESSING CAPABILITY
A system includes a first light source that projects lines of light onto an object, a second light source that illuminates markers on or near the object, one or more image sensors that receive first reflected light from the projected lines of light and second reflected light from the illuminated markers, one or more processors that determine the locations of the lines of light on the image sensors based on the first reflected light and that determines the locations of the markers on the image sensors based on the second reflected light, and a frame physically coupled to the first light source, the second light source, the one or more image sensors, and the one or more processors.
Three-dimensional measurement device
To perform three-dimensional measurement of an object with high accuracy, a dot pattern is generated by a determination process of determining a reference position according to a rule defined by a Poisson disk sampling algorithm, a selection process of selecting one of a plurality of arrangement patterns indicating at least one or more dot arrangements, an arrangement process of arranging dots based on the arrangement pattern selected for the reference position, and an iterative process of performing the above processes a plurality of times, a projection device is controlled to project projection light including the dot pattern onto the object, an image capturing device is controlled to image-capture the object onto which the projection light is projected from two directions to acquire two captured images, parallax information is calculated about the acquire two captured images, and a three-dimensional shape of the object is specified based on the calculated parallax information.
METHOD, APPARATUS AND SYSTEM FOR THREE-DIMENSIONAL RECONSTRUCTION
Disclosed in the present disclosure are a method, apparatus and system for three-dimensional reconstruction. The method includes: projecting a first image onto a surface of a measured object to obtain a second image; determining, in the first image, a plurality of candidate code elements corresponding to any code element in the second image, and determining, from the plurality of candidate code elements, a target code element corresponding to the any code element to complete matching between the code elements in the first image and the second image; and determining three-dimensional coordinates of the code elements in the second image based on a matching relationship between the code elements in the first image and the second image and predetermined three-dimensional coordinates of the code elements in the first image, and determining three-dimensional coordinates of the measured object based on the three-dimensional coordinates of the code elements to complete three-dimensional reconstruction.