The systems and methods described herein include a device that can scan the surrounding environment and construct a 3D image, map, or representation of the surrounding environment using, for example, invisible light projected into the environment. In some implementations, the device can also project into the surrounding environment one or more visible radiation pattern patterns (e.g., a virtual object, text, graphics, images, symbols, color patterns, etc.) that are based at least in part on the 3D map of the surrounding environment.

A triangulation scanner having an enclosure, a projector coupled to the enclosure and configured to emit a first light, and three cameras also coupled to the enclosure. The scanner further includes at least one processor to determine the three-dimensional coordinates in a local frame of reference based at least in part on receiving the first light.

A depth data measuring head (300), a measurement device (1400) and a measurement method. The measuring head (300) comprises: a projection device (310, 1410) used to project and scan line coded structured light across a region to be photographed; first and second image sensors (310_1, 310_2, 1410_1, 1410_2) disposed at preset relative positions and used to photograph said region so as to respectively obtain first and second two-dimensional image frames under irradiation of the structured light; and a synchronization device (330, 1430) used to synchronously activate, on the basis of a scan position of the projection device, pixel columns of the first and second image sensors (310_1, 310_2, 1410_1, 1410_2) in a line direction corresponding to the current scan position to perform imaging.

One example of an inspection system includes a laser, a magnification changer, and a first camera. The laser projects a line onto a wafer to be inspected. The magnification changer includes a plurality of selectable lenses of different magnification. The first camera images the line projected onto the wafer and outputs three-dimensional line data indicating the height of features of the wafer. Each lens of the magnification changer provides the same nominal focal plane position of the first camera with respect to the wafer.

One embodiment can provide a machine-vision system that includes one or more stereo-vision modules. A respective stereo-vision module can include a structured-light projector, a first camera positioned on a first side of the structured-light projector, and a second camera positioned on a second side of the structured-light projector. The first and second cameras are configured to capture images of an object under illumination by the structured-light projector. The structured-light projector can include a laser-based light source and an optical modulator configured to reduce speckles caused by the laser-based light source.

The group of inventions relates to measuring technology, in particular to methods for inspection of the shape of hard-to-reach parts, and can be used in power engineering, transport, mechanical engineering and other fields of technology to measure the geometric parameters of a part. The technical result of the invention as claimed is to increase the accuracy, reliability and performance of measurements related to determining the shape and defects of parts installed in cavities, as well as the shape of the internal cavities of products and surface discontinuities. The method for controlling the shape of hard-to-reach parts, including the stages of delivery inside the controlling equipment of the executive part of the control system equipped with a miniature stereo camera, for navigation across the path of which white light illumination is used, the white light illumination is transmitted through an optical fiber, after leaving which the given indicatrix of intensity is formed by means of the first lens. This is followed by the stage of turning off or dimming the white light, followed by turning on the laser, which, by means of an optical fiber transmitting a laser stream passing through the second lens, forms a beam of rays, which, passing through a diffraction optical element, forms an image with small laser spots of intensity on the hard-to-reach surface of the part to obtain a stereo image of the hard-to-reach surface of the part. A three-dimensional hard-to-reach surface is restored, while laser intensity spots on a pair of flat images are used to automatically identify the same points of object on stereo images with a given degree of confidence. The inspection system consists of a miniature digital camera that forms a stereo image of the object under control, a white light illumination unit, a laser illuminator operating in pulsed or continuous mode, a handle placed on the articulation control panel, a PC for processing and displaying information, articulation cables, two lenses, DOE, a laser fiber, lighting fiber, power line and a video signal transmission line.

An improved vehicle surface scanning system for assessing the damaged surfaces of a vehicle with resulting estimates of repair costs. A mobile scanning booth is assembled in an open-ended tunnel-like rig having a plurality of reflective panels positioned along opposite sides and across the roof of the booth to serve as deflection screens. A plurality of scanner modules are mounted in fixed positions about opposite ends of the booth and positioned to face the interior of the booth. Wheels provide controlled locomotion/movement of the scanning booth over the vehicle. The scanner modules use a combined hybrid methodology of active stereo 3D reconstruction and deflectometry to acquire data measurements along the surfaces of the vehicle incrementally as the booth is moved. The incremental measurement data acquired during the mobile scanning is processed and furthermore combined to produce accurate reports of the damage surfaces and estimates of associated repair costs.

A camera system, a mobile terminal, and a three-dimensional image acquisition method are disclosed. The camera system may include, a first photographing device, a second photographing device, a photographing assistance device, and a processor; the photographing assistance device is configured to emit a first feature light to an object; the first photographing device is configured to collect a second feature light reflected by the object; the second photographing device includes a main camera configured to collect a first image of the object and a secondary camera configured to collect a second image of the object; and the processor is configured to acquire depth information of the object according to the second feature light, and perform feature fusion on the first and second images, and perform stereo registration on a result of feature fusion and the depth information, to acquire a 3D image of the object.

A topography measurement system includes a radiation source; a first grating; imaging optics; a movement mechanism; detection optics; a second grating; and a detector. The radiation source is configured to generate a radiation beam and includes a light emitting diode to produce to the radiation. The first grating is configured to pattern the radiation beam. The imaging optics is configured to form a first image of the first grating at a target location on a substrate. The movement mechanism is operable to move the substrate relative to the image of the first grating such that the target location moves relative to the substrate. The detection optics is configured to receive radiation from the target location of the substrate and form an image of the first image at the second grating. The detector is configured to receive radiation transmitted through the second grating and produce an output signal.

Systems, devices, and techniques related to matching features between a dynamic vision sensor and one or both of a dynamic projector or another dynamic vision sensor are discussed. Such techniques include casting a light pattern with projected features having differing temporal characteristics onto a scene and determining the correspondence(s) based on matching changes in detected luminance and temporal characteristics of the projected features.