Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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1/00
Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
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G01R1/02
General constructional details
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G01R1/06
Measuring leads; Measuring probes
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G01R1/07307
with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
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G01R1/07364
with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
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G01R1/07371
using an intermediate card or back card with apertures through which the probes pass
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