A semiconductor device includes an integrated circuit that is disposed at a first face side of a semiconductor substrate, the semiconductor substrate having a first face and a second face, the second face opposing the first face, the semiconductor substrate having a through hole from the first face to the second face; an external connection terminal that is disposed at the first face side; a conductive portion that is disposed in the through hole, the conductive portion being electrically connected to the external connection terminal; and an electronic element that is disposed at a second face side.

A plurality of gate finger electrodes (2) is each arranged in a manner alternately adjacent to a corresponding one of drain electrodes (3) and a corresponding one of source electrode (4). The plurality of gate finger electrodes (2) is each connected to a corresponding one of gate routing lines (6). A resistor (7) has one end separating the gate routing lines (6) on respective two sides at a center portion between the gate routing lines (6), and has another end connected to an input line (10). Capacitors (8) are arranged on the respective two sides with respect to the resistor (7) and each connected to the corresponding gate routing line (6) by a corresponding one of air bridges (9).

A semiconductor device according to the present invention includes the following: a conductive layer disposed on an insulating substrate; a first semiconductor element and a second semiconductor element that are joined on an opposite surface of the conductive layer opposite from the insulating substrate, with a gap the first semiconductor element and the second semiconductor element; an electrode joined on an opposite surface of the first semiconductor element opposite from the conductive layer, and an opposite surface of the second semiconductor element opposite from the conductive layer, so as to extend over the gap; and resin sealing the conductive layer, the first semiconductor element, the second semiconductor element, and the electrode. The conductive layer has a recess pattern that is disposed on a surface being opposite from the insulating substrate and facing the gap, the recess pattern extending along the gap.

A semiconductor device of an embodiment includes a first region including a first portion of a semiconductor layer having first and second planes, a first trench, a first gate electrode, a first source electrode and a drain electrode; a second region adjacent to the first region in a first direction and including a second portion of the semiconductor layer, a second trench, a second gate electrode, a second source electrode on the first plane side, and the drain electrode; a third region adjacent to the first region in a second direction crossing the first direction and including a third portion of the semiconductor layer, a third trench, a third gate electrode, a third source electrode on the first plane side, and the drain electrode; a first gate electrode pad connected to the first gate electrode; and a second gate electrode pad connected to the second and third gate electrodes.

A semiconductor device includes an integrated circuit that is disposed at a first face side of a semiconductor substrate, the semiconductor substrate having a first face and a second face, the second face opposing the first face, the semiconductor substrate having a through hole from the first face to the second face; an external connection terminal that is disposed at the first face side; a conductive portion that is disposed in the through hole, the conductive portion being electrically connected to the external connection terminal; and an electronic element that is disposed at a second face side.

A chip package including a substrate having an upper surface, a lower surface, and a sidewall surface that is at the edge of the substrate is provided. The substrate includes a sensor device therein and adjacent to the upper surface thereof. The chip package further includes light-shielding layer disposed over the sidewall surface of the substrate and extends along the edge of the substrate to surround the sensor device. The chip package further includes a cover plate disposed over the upper surface of the substrate and a spacer layer disposed between the substrate and the cover plate. A method of forming the chip package is also provided.

An improvement is achieved in the performance of a semiconductor-device. The semiconductor device includes MISFETs formed in the upper surface of a substrate, a plurality of wiring layers stacked over the upper surface of the substrate, and a plurality of plugs each coupling two of the wiring layers to each other. The wiring layers located under the uppermost wiring layer include wires. The uppermost wiring layer includes a pad, an insulating film formed over the pad, and an opening extending through the insulating film and reaching the pad. The MISFETs and the wires overlap the opening in plan view. None of the plurality of plugs overlaps the opening in plan view.

Field-effect transistor (FET) devices are described herein that include one or more body contacts implemented near source, gate, drain (S/G/D) assemblies to improve the influence of a voltage applied at the body contact on the S/G/D assemblies. For example, body contacts can be implemented between S/G/D assemblies rather than on the ends of such assemblies. This can advantageously improve body contact influence on the S/G/D assemblies while maintaining a targeted size for the FET device.

A semiconductor package includes a semiconductor die having a semiconductor device, and first and second contact pads arranged on opposite surfaces of the die. The semiconductor die is embedded in a dielectric layer. The semiconductor package also includes one or more first package contact pads and one or more second package contact pads arranged on a first major surface of the semiconductor package. The first contact pad of the die is coupled to the one or more first package contact pads, and the second contact pad of the die is coupled to the one or more second package contact pads. In operation, the semiconductor device causes a current path between the first contact pad and the second contact pad. The package contact pads are arranged on the first major surface of the semiconductor package to provide multiple non-parallel current paths.

A semiconductor device that outputs a radio-frequency (RF) signal with high power is disclosed. The semiconductor device includes a housing, a semiconductor chip, an impedance converter, a capacitor, and a bonding wire. The housing includes a heat sink, an output lead terminal, and a bias terminal electrically isolated from the output lead terminal. The semiconductor chip is mounted on the heat sink of the housing. The impedance converter provides an input port, an output port, and an intermediate port between the input port and the output port thereof. The capacitor is mounted on the heat sink and between the impedance converter and the output lead terminal. The bonding wire connects the bias lead terminal with the intermediate port.