ACCELEROMETERS
20190242925 ยท 2019-08-08
Inventors
Cpc classification
International classification
Abstract
A method for controlling closed loop operation of a capacitive accelerometer comprises applying first in-phase and anti-phase PWM drive signals, respectively, to a first pair of fixed capacitive electrodes and applying second in-phase and anti-phase PWM drive signals, respectively, to a second pair of fixed capacitive electrodes. A displacement of a proof mass relative to fixed capacitive electrodes is sensed by measuring a pickoff signal from the proof mass and adjusting the mark-space ratio of the first and/or second PWM drive signals to provide a restoring force on the proof mass that balances an applied acceleration and maintains the proof mass at a null position. The first and second PWM drive signals applied to the first and second pairs of fixed capacitive electrodes are offset in time from one another by an offset period.
Claims
1. A method for controlling closed loop operation of a capacitive accelerometer, the capacitive accelerometer comprising: a fixed substrate; a proof mass mounted to the fixed substrate by flexible support legs for in-plane movement along a sensing axis in response to an applied acceleration, wherein the proof mass comprises a plurality of sets of moveable electrode fingers extending substantially perpendicular to the sensing axis and spaced apart along the sensing axis; at least two pairs of fixed capacitive electrodes, wherein a first pair of the fixed capacitive electrodes comprises a first fixed electrode and a fourth fixed electrode, and a second pair of the fixed capacitive electrodes comprises a second fixed electrode and a third fixed electrode, and wherein each fixed capacitive electrode comprises a set of fixed capacitive electrode fingers extending substantially perpendicular to the sensing axis and spaced apart along the sensing axis, wherein the sets of fingers of the first and third fixed electrodes are arranged to interdigitate with the sets of moveable electrode fingers with a first offset in one direction along the sensing axis from a median line between adjacent fixed fingers, and the sets of fingers of the second and fourth fixed electrodes are arranged to interdigitate with the sets of moveable electrode fingers with a second offset in the opposite direction along the sensing axis from a median line between adjacent fixed fingers; the method comprising: applying first in-phase and anti-phase PWM drive signals, respectively, to the first pair of fixed capacitive electrodes and applying second in-phase and anti-phase PWM drive signals, respectively, to the second pair of fixed capacitive electrodes; and sensing a displacement of the proof mass relative to the fixed capacitive electrodes by measuring a pickoff signal from the proof mass and adjusting the mark-space ratio of the first and/or second PWM drive signals to provide a restoring force on the proof mass that balances an applied acceleration and maintains the proof mass at a null position; wherein the first and second PWM drive signals applied to the first and second pairs of fixed capacitive electrodes are offset in time from one another by an offset period.
2. A method as claimed in claim 1, wherein the offset period is adjusted dependent on
3. A method as claimed in claim 1, wherein measuring the pickoff signal comprises taking a first sample after a transition in the first PWM drive signals and taking a second sample after another transition in the first PWM drive signals.
4. A method as claimed in claim 3, wherein measuring the pickoff signal further comprises taking a third sample after a transition in the second PWM drive signals and taking a fourth sample after another transition in the second PWM drive signals.
5. A method as claimed in claim 4, further comprising determining a difference between the first and second samples to give a first error signal, and using the first error signal to adjust the mark-space ratio of the first PWM drive signals.
6. A method as claimed in claim 4, further comprising determining a difference between the third and fourth samples to give a second error signal, and using the second error signal to adjust the mark-space ratio of the second PWM drive signals.
7. A method as claimed in claim 3, further comprising performing time division multiplexing after sampling in order to separate data corresponding to the first PWM drive signals from data corresponding to the second PWM drive signals.
8. A method as claimed in claim 1, further comprising measuring the pickoff signal from the proof mass after a settling period no longer than a predetermined time from a transition in the first or second PWM drive signals.
9. A method as claimed in claim 1, further comprising summing values of the mark-space ratios of the first and second PWM drive signals to determine the applied acceleration.
10. A method as claimed in claim 1, further comprising differencing values of the mark-space ratios of the first and second PWM drive signals to determine compensation information relating to any temperature and/or stress gradients across the accelerometer.
11. A control apparatus for controlling closed loop operation of a capacitive accelerometer, the capacitive accelerometer comprising: a fixed substrate and a proof mass mounted to the fixed substrate by flexible support legs for in-plane movement along a sensing axis in response to an applied acceleration; the proof mass comprising a plurality of sets of moveable electrode fingers extending substantially perpendicular to the sensing axis and spaced apart along the sensing axis; at least two pairs of fixed capacitive electrodes, wherein a first pair of the fixed capacitive electrodes comprises a first fixed electrode and a fourth fixed electrode, and a second pair of the fixed capacitive electrodes comprises a second fixed electrode and a third fixed electrode, and wherein each fixed capacitive electrode comprises a set of fixed capacitive electrode fingers extending substantially perpendicular to the sensing axis and spaced apart along the sensing axis; wherein the sets of fingers of the first and third fixed electrodes are arranged to interdigitate with the sets of moveable electrode fingers with a first offset in one direction along the sensing axis from a median line between adjacent fixed fingers, and the sets of fingers of the second and fourth fixed electrodes are arranged to interdigitate with the sets of moveable electrode fingers with a second offset in the opposite direction along the sensing axis from a median line between adjacent fixed fingers; the apparatus comprising: at least two pairs of PWM voltage generators, wherein the first pair of PWM voltage generators is arranged to generate and apply first in-phase and anti-phase PWM drive signals to the first pair of fixed capacitive electrodes, and wherein the second pair of PWM voltage generators is arranged to generate and apply second in-phase and anti-phase PWM drive signals to the second pair of fixed capacitive electrodes; a pickoff signal sensor arranged to sample a pickoff signal from the proof mass at least four times per first and second PWM drive signal cycle; first and second feedback loops, each arranged to adjust the mark-space ratio of the respective first and second PWM drive signals generated by the two pairs of PWM voltage generators, depending on the pickoff signal; wherein the first and second PWM drive signals are offset in time from one another by an offset period.
12. The apparatus of claim 11, wherein the offset period is adjusted dependent on the mark-space ratio.
13. The apparatus of claim 11, wherein the pickoff signal sensor is further arranged to measure the pickoff signal by taking a first sample after a transition in the first PWM drive signals, taking a second sample after another transition in the first PWM drive signals, taking a third sample after a transition in the second PWM drive signals, and taking a fourth sample after another transition in the second PWM drive signals; and further comprising: a first PWM demodulator arranged to determine a difference between the first and second samples to give a first error signal; a second PWM demodulator arranged to determine a difference between the third and fourth samples to give a second error signal; a first digital loop filter arranged to use the first error signal to adjust the mark-space ratio of the first PWM drive signals; and a second digital loop filter arranged to use the second error signal to adjust the mark-space ratio of the second PWM drive signals.
14. The apparatus of claim 11, further comprising a processor arranged to sum values of the mark-space ratios of the first and second PWM drive signals to determine the applied acceleration.
15. The apparatus of claim 11, further comprising a processor arranged to difference values of the mark-space ratios of the first and second PWM drive signals to determine compensation information relating to any temperature and/or stress gradients across the accelerometer.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0026] One or more non-limiting examples will now be described with reference to the accompanying drawings, in which:
[0027]
[0028]
[0029]
[0030]
[0031]
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DETAILED DESCRIPTION
[0034]
[0035] Of course, the geometry of the accelerometer 100 could be reversed and the proof mass could instead be positioned inside a fixed outer frame.
[0036] As seen in the close-up part of
[0037] The fixed capacitive electrodes 106a, 106b, 108a, 108b are driven by pulse width modulation (PWM) drive signals. Within a pair of fixed capacitive electrodes, for example 106a, 106b, one electrode is driven by an in-phase PWM drive signal, while the other is driven by an anti-phase PWM drive signal. In closed loop operation, the mark-space ratio of the PWM drive signals is dynamically altered in response to an inertial acceleration applied to the accelerometer 100, in order to provide an electrostatic restoring force to the proof mass 102. This control scheme keeps the proof mass 102 in a null position under normal operating conditions, and allows for sensing of an applied acceleration.
[0038] In this prior art example, the first and third fixed electrodes 106a, 108a are driven together by having the same in-phase PWM drive signals applied, and the second and fourth fixed electrodes 106b, 108b are driven together by having the same anti-phase PWM drive signals applied. This means that in the case of a uniform temperature change, all four sets of fixed electrode fingers move in the same way, and therefore cancel out any differences in differential capacitance measured from the proof mass 102. However, this structure is susceptible to temperature gradients, as a residual bias shift would still be present under a temperature gradient. This may occur, for example, if the bonding between the support and silicon layers is not symmetrical with respect to the centre of the device 100.
[0039] The following examples assume an operating drive frequency of 50 kHz, and therefore a period of 20 s for a full PWM cycle.
[0040]
[0041] First PWM voltage generator 212 generates a first in-phase PWM drive signal and is connected to the first fixed electrode 106a. Second PWM voltage generator 214 generates a corresponding first anti-phase PWM drive signal, and is connected to the fourth fixed electrode 108b. First and fourth fixed electrodes 106a and 108b make up the first differential pair. Third PWM voltage generator 216 generates a second in-phase PWM drive signal and is connected to the third fixed electrode 108a. Fourth PWM voltage generator 218 generates a corresponding second anti-phase PWM drive signal, and is connected to the second fixed electrode 106b. Second and third fixed electrodes 106a and 108b make up the second differential pair.
[0042] The connection between the charge amplifier 202 and the proof mass 102 provides a pickoff signal, representative of the proof mass offset under an applied inertial acceleration, to the charge amplifier 202. The charge amplifier 202 comprises an analogue to digital converter (ADC) that samples the pickoff signal at the proof mass 102 four times per PWM cycle. The exact timing of the sample depends on multiple factors. The ADC samples the signal at the proof mass 102 at a time after a settling period, for example 2 s, from a previous sample, or a PWM drive signal transition. A settling period of 2 s is typical for standard accelerometer electronics. This value is dependent on the exact specifications of the ADC and the PWM voltage generators. The PWM voltage generators have a maximum slew rate, and therefore a minimum ramp-up time on their voltage output, for example 800 ns. This ramp-up can introduce transient signals into the drive voltage, and they must therefore be allowed to decay before a sample is taken, to ensure low noise, high performance operation.
[0043] The first and second PWM drive signals are offset in time from one another by an offset period. This offset period changes with the mark-space ratio to ensure that the four samples in a cycle are never within the predetermined settling period. This settling time allows for any transient signals to decay before a sample is taken. The charge amplifier 202 then performs time division multiplexing, and passes the respective signals to PWM demodulators 204, 206.
[0044] The first PWM demodulator 204 takes the two samples from the first pair of coupled, fixed electrodes 106a, 108b, and calculates a first error signal based on the difference of the two sample values. The second PWM demodulator 206 takes the two samples from the second pair of coupled, fixed electrodes 106b, 108a, and calculates a second error signal based on the difference of the two sample values. These error signals are representative of the offset of the proof mass 102 from the null position. The first and second error signals are equal to zero for a 50:50 mark-space ratio, corresponding to the proof mass 102 being in the null position. The change in PWM mark-space ratio is linear with the applied acceleration. The first and second error signals are then passed to the PWM digital loop filters 208, 210.
[0045] PWM digital loop filter 208 takes the first error signal from PWM demodulator 204, and calculates a corresponding first PWM mark-space ratio that will provide the proof mass 102 with the sufficient electrostatic restoring force (in combination with the restoring force from the second PWM drive signal) to return it to the null position. PWM digital loop filter 210 takes the second error signal from PWM demodulator 206, and calculates a corresponding second PWM mark-space ratio that will provide the proof mass 102 with the sufficient electrostatic restoring force (in combination with the restoring force from the first PWM drive signal) to return it to the null position. It is the sum of the two electrostatic restoring forces that cause the proof mass 102 to return to the null position.
[0046] The respective calculated mark-space ratio is then passed from the PWM digital loop filters 208, 210, to the corresponding PWM voltage generator 212, 214, 216, 218. PWM digital loop filter 208 provides PWM voltage generators 212, 214 with their respective mark-space ratios. PWM digital loop filter 210 provides PWM voltage generators 216, 218 with their respective mark-space ratios.
[0047] Optionally a processor 220 takes a value of the first and second mark-space ratios from the PWM loop filters 208, 210, and performs calculations and/or comparisons on the values. For example, the sum of the two values provides an acceleration output 222 that is representative of the applied linear acceleration. For example, the difference of the two values provides compensation information 224 that can later be used to remove the effects of stress/temperature-induced movement that would normally cause an accelerometer bias.
[0048] The processor 220, or another external processor connected thereto, can also calculate a thermal model of the accelerometer, making use of the compensation information 224, in order to compensate for bias or scale factor differences arising from temperature or stress gradients. The compensation information 224 may be combined with a sensed operating temperature for the accelerometer 100, for example as measured by an external temperature sensor. The processor 220, or other external processor, can apply this model to the acceleration output 222 after calibration, for example using a thermal compensation algorithm, to correct any errors arising from the gradients detailed above. If the processor receives additional compensation information (e.g. temperature), this model will be improved. Thus, any errors can be better corrected for, and the accelerometer output 222 after such compensation will better represent the applied linear acceleration.
[0049]
[0050]
[0051] Overall, the mean of the two pairs of PWM drive signal mark-space ratios gives information relating to the applied inertial acceleration, whereas the difference between the two pairs of mark-space ratios gives compensation information. This compensation information can then be used to remove effects such as thermal hysteresis due to mounting stresses, long term thermal cycling effects, or long term ageing due to stress relief within the device 100 package.
[0052]
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[0054] It will be understood that as the mark-space ratio moves further away from 50:50, the two pairs of PWM drive signals have a reduced offset period, i.e. to maintain a maximum offset, whilst preserving the minimum settling period value.
[0055] As the ADC in the charge amplifier 202 requires a 1 s window to sample the proof mass 102, it will be seen that the maximum mark-space ratio that can be achieved whilst operating at 50 kHz is 30:70. The duration of this sampling window is entirely dependent on the specifications of the ADC that is used, and could be much shorter or longer.
[0056] Beyond the standard operating g-range of the accelerometer, the device will continue to function as described above, except that the charge amplifier 202 will reduce the minimum settling period, instead sampling the proof mass 102 at the appropriate time. Therefore, the maximum mark-space ratio can be extended e.g. up to 75:25, with reduced performance. This is due to the introduction of errors into the accelerometer, caused by the reduced settling period. It will be understood that the accelerometer will perform optimally up until a mark-space ratio of 70:30, corresponding to an applied acceleration of around 30 g. Beyond this value the accelerometer will still provide an acceleration output, but it will not be as accurate as under 30 g. Of course, a smaller settling period e.g. <2 s will allow a higher mark-space ratio to be achieved, corresponding to a higher g-level.
[0057]
[0058] PWM drive signals 706, 708 show a mark-space ratio of 60:40, corresponding to a low g applied inertial acceleration. As before, the sample timings are delayed from any PWM drive signal transition by the minimum settling period, in this case 2 s. The two PWM drive signals 706, 708 are offset from each other by 4 s in this example.
[0059] PWM drive signals 710, 712 show a mark-space ratio of 40:60 corresponding to a low g applied inertial acceleration, but in the opposite direction as in the case of a 60:40 mark-space ratio. As before, the sample timings are delayed from any PWM drive signal transition by the minimum settling period, in this case 2 s. The two PWM drive signals 706, 708 are offset from each other by 4 s in this example.
[0060] PWM drive signals 714, 716 show a mark-space ratio of 30:70, corresponding to a high g applied inertial acceleration. As before, the sample timings are delayed from any PWM drive signal transition by the minimum settling period, in this case 2 s. It can be seen in this example that this mark space ratio of 30:70 is the maximum that this control scheme will support, whilst maintaining a minimum settling period of 2 s for sample timings, and a 1 s window for ADC sampling. The two PWM drive signals 706, 708 are offset from each other by 3 s in this example.
[0061] PWM drive signals 718, 720 show a mark-space ratio of 70:30, corresponding to a high g applied inertial acceleration, but in the opposite direction as in the case of a 30:70 mark-space ratio. As before, the sample timings are delayed from any PWM drive signal transition by the minimum settling period, in this case 2 s. Again, it can be seen in this example that this mark space ratio of 70:30 is the maximum that this control scheme will support, whilst maintaining a minimum settling period of 2 s for sample timings, and a 1 s window for ADC sampling. The two PWM drive signals 706, 708 are offset from each other by 3 s in this example.