Multi-channel system for truck and cargo scanning using impulse radiation sources

Abstract

A multi-channel system for truck scanning, includes an impulse radiation source; and a plurality of detection circuits, each detection circuit comprising a scintillator, a photodiode, a supplemental circuit, an integrator and an ADC, connected in series. A current of the photodiode is proportional to radiation from the impulse radiation source. A data storage device stores outputs of the ADCs and provides the outputs to a computer that converts them to a shadow image of the scanned truck. The supplemental circuit isolates a capacitance of the photodiode from the integrator, filters out low frequency signals from the photodiode, amplifies the signal from the photodiode and reduces a bandwidth of the photodiode seen by the integrator. The supplemental circuit reduces an influence of capacitance of the photodiode on system noise, increases a signal-to-noise ratio of the system, and reduces an influence of photodiode temperature changes on a quality of the scanned image.

Claims

1. A multi-channel system for truck scanning, comprising: an impulse radiation source; a plurality of detection circuits, each detection circuit comprising a scintillator, a photodiode, a supplemental circuit, an integrator and an Analog to Digital Converter (ADC), connected in series, wherein a current of the photodiode is proportional to impulse gamma radiation from the impulse radiation source; a data storage device storing outputs of the ADCs and providing the stored outputs to a computer that converts the outputs to a shadow image of the scanned truck, wherein the supplemental circuit isolates a capacitance of the photodiode from the integrator, filters out low frequency signals from the photodiode, amplifies the signal from the photodiode and reduces a bandwidth of the photodiode seen by the integrator.

2. The system of claim 1, wherein the supplemental circuit reduces an influence of capacitance of the photodiode on system noise.

3. The system of claim 1, wherein the supplemental circuit increases a signal-to-noise ratio of the system.

4. The system of claim 1, wherein the supplemental circuit reduces an influence of photodiode temperature changes on a quality of the scanned truck image.

5. The system of claim 1, wherein the supplemental circuit comprises: a low-noise operational amplifier, wherein an output of the photodiode is connected to an inverting input of the amplifier, and a non-inverting input of the low-noise operational amplifier is connected to ground, a first resistor and a first capacitor, connected in parallel between an output of the low-noise operational amplifier and the inverting input of the low-noise operational amplifier, a second resistor, a third resistor and a blocking capacitor, connected in series between the output of the low-noise operational amplifier and an output of the supplemental circuit, and a second capacitor connected between the ground and a point between the second and third resistors.

6. The system of claim 5, wherein the first resistor is at least 2 M.

7. The system of claim 5, wherein the second resistor is 100 K-600 K.

8. The system of claim 5, wherein the third resistor is 100 K-600 K.

9. The system of claim 5, wherein the first capacitor is 15-30 pF.

10. The system of claim 5, wherein the second capacitor is 200-240 pF.

11. The system of claim 5, wherein the blocking capacitor is 1200-3000 pF.

12. The system of claim 5, wherein the low-noise operational amplifier has a bias voltage of up to 100 V and a bias current of up to 10 pA.

13. The system of claim 1, wherein the impulse radiation source is a betatron.

14. The system of claim 1, wherein the impulse radiation source generates pulses of about 2 microsecond duration.

15. A multi-channel system for object scanning, comprising: an impulse radiation source; a plurality of detection circuits, each detection circuit comprising a scintillator, a photodiode, a supplemental circuit, an integrator and an Analog to Digital Converter (ADC), connected in series, wherein the photodiode produces an output that is proportional to radiation from the impulse radiation source; a computer that converts the outputs of the photodiodes to a shadow image of the scanned truck, wherein the supplemental circuit isolates a capacitance of the photodiode from the integrator, amplifies the signal from the photodiode and reduces a bandwidth of the photodiode seen by the integrator.

16. The system of claim 15, wherein the supplemental circuit filters out low frequency signals from the photodiode.

17. The system of claim 15, wherein the supplemental circuit reduces an influence of photodiode temperature changes on a quality of the scanned image.

18. The system of claim 15, wherein the supplemental circuit comprises an operational amplifier, wherein an output of the photodiode is connected to an inverting input of the amplifier, and a non-inverting input of the operational amplifier is connected to ground, a first resistor and a first capacitor, connected in parallel between an output of the operational amplifier and the inverting input of the operational amplifier, a second resistor, a third resistor and a blocking capacitor, connected in series between the output of the operational amplifier and an output of the supplemental circuit, and a second capacitor connected between the ground and a point between the second and third resistors.

Description

BRIEF DESCRIPTION OF THE ATTACHED FIGURES

[0015] The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention.

[0016] In the drawings:

[0017] FIG. 1 illustrates a conventional multi-channel system for truck scanning.

[0018] FIG. 2 illustrates a multi-channel system for truck scanning with a supplemental amplifier circuit.

[0019] FIG. 3 shows an electronic schematic of one channel containing a supplemental circuit and an integrator.

[0020] FIG. 4 shows the performance of a conventional detector.

[0021] FIG. 5 shows the performance of a detector of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0022] Reference will now be made in detail to the preferred embodiments of the present invention, examples of which are illustrated in the accompanying drawings.

[0023] To overcome these drawbacks, a supplemental circuit is installed between the photodiodes and integrators, the circuit comprising a low-noise operational amplifier with a low bias voltage of 50-100 V and a bias current of 1-10 pA, along with a high and low frequency filter. Also, the amplifier's non-inverting input is connected to a common bus, while its inverting input is connected to a photodiode.

[0024] Between the amplifier's output and its inverting input, there is a high-value first resistor (around several M) shunted with a smaller capacitance (about 15-30 pF). The amplifier's output is connected to the integrator's input, via second and third resistors and a blocking capacitor connected in series, while the connection point between the second and third resistors is connected to the circuit's common bus, via a second capacitor, as shown in FIG. 2, which illustrates a multi-channel system for truck scanning with a supplemental amplifier circuit.

[0025] In FIG. 2, 101.sub.1-101.sub.n are scintillators; 102.sub.1-102.sub.n are photodiodes; 103.sub.1-103.sub.n are integrators; 104.sub.1-104.sub.n are analog-to-digital converters; 105 is a data storage device; 106 is a computer; 107 is an impulse radiation source; 208.sub.1-208.sub.n is a supplemental amplifier circuit. The supplemental circuit isolates a capacitance of the photodiode from the integrator, filters out low frequency signals from the photodiode, amplifies the signal from the photodiode and reduces a bandwidth of the photodiode seen by the integrator.

[0026] This solution allows to coordinate signal transfer bandwidth and betatron impulse signal bandwidth with integration time by changing the capacitance that shunts the first resistor, where the cut off frequency f.sub.c for photodiode signal is determined by the equation 2f.sub.cR.sub.1C.sub.1=1, where R.sub.1 is the first resistor value, C.sub.1 is its shunting capacitance, while the noise bandwidth f.sub.n is determined by the integration chain second resistorsecond capacitor, where 2 f.sub.nR.sub.2C.sub.2=1.

[0027] By adding a blocking capacitor at the integrator's input, it is possible to make the output code baseline independent both from temperature fluctuations and possible slight exposure of scintillators to external light signals of constant intensity (e.g., sunlight).

[0028] Also, when a supplemental circuit is added, integrator noise is no longer influenced by high photodiode capacitance, as the circuit separates photodiodes from integrators.

[0029] Moreover, the supplemental circuit 208 significantly improves total sensitivity of the system by photodiode signal-based amplification, which is K=R.sub.1/(R.sub.2+R.sub.3), where R.sub.1 is the first resistor of the supplemental circuit, while R.sub.2 and R.sub.3 are its second and third resistors correspondingly.

[0030] FIG. 3 shows an electronic schematic of one channel containing a supplemental circuit and an integrator. In FIG. 3, 310 is a supplemental circuit; 311 is a photodiode; 312 is an operational amplifier; 313 is a first resistor R.sub.1; 314 is a shunting capacitor C.sub.1; 315 is a second resistor R.sub.2; 316 is a second capacitor C.sub.2; 317 is a third resistor R.sub.3; 318 is a blocking capacitor C.sub.3 of the high-pass filter.

[0031] The blocking capacitor and R.sub.2+R.sub.3 are chosen, so that the operational amplifier's output signal would charge the integrator's capacitor up to 90-95% of its maximum value at a pre-set integration time (e.g., at betatron impulse duration of 2 s, radiation period of 2500 s, and integration time of 50 s):

[0032] a) if R.sub.2+R.sub.3=200 k, then C.sub.3=1200-1500 pF;

[0033] b) if R.sub.2+R.sub.3=100 k, then C.sub.3=2400-3000 pF.

[0034] Thermal noise of a feedback resistor is

[00001]$\begin{array}{cc}\sqrt{\stackrel{\_}{U_{\mathrm{noise},T}^2}}=\sqrt{4.Math..Math.{\mathrm{kTR}}_1.Math..Math..Math.f}=8.61.Math..Math.\mathrm{.Math.V},& \left(1\right)\end{array}$

[0035] where k=1.38.Math.10.sup.23 J/K is Boltzmann constant;

[0036] T=300 K is temperature;

[0037] R.sub.1=5.6 M is resistance of the feedback resistor;

[0038] f=800 Hz is transfer bandwidth.

[0039] Dark noise of a photodiode is

[00002]$\begin{array}{cc}\sqrt{\stackrel{\_}{U_{\mathrm{noise},d}^2}}=\sqrt{2.Math..Math.{\mathrm{qI}}_d.Math.R_1.Math..Math..Math.f}=2.85.Math..Math.\mathrm{.Math.V},& \left(2\right)\end{array}$

[0040] where q=1.6.Math.10.sup.19 C;

[0041] I.sub.d=10.sup.9 A is dark current of the photodiode.

[0042] Therefore, total noise of the supplemental circuit is

[00003]$\begin{array}{cc}\sqrt{\stackrel{\_}{U_{\mathrm{noise},\mathrm{tot}}^2}}=\sqrt{\stackrel{\_}{U_{\mathrm{noise},T}^2}+\stackrel{\_}{U_{\mathrm{noise},d}^2}}=9.Math..Math.\mathrm{.Math.V}.& \left(3\right)\end{array}$

[0043] Then, noise current at the input of the integration chain is

[00004]$\begin{array}{cc}{I}_{\mathrm{in}}=\frac{\sqrt{\stackrel{\_}{U_{\mathrm{noise},\mathrm{tot}}^2}}}{R_2+R_3}=45.Math.{10}^{-12}.Math..Math.A,& \left(4\right)\end{array}$

[0044] and its noise charge is

Q.sub.noise=I .sub.in.Math.t.sub.in=2250.Math.10.sup.18 C, (5)

[0045] where t.sub.in=50.Math.10.sup.6 s is integration time.

[0046] Since the Q.sub.tot range of ADC DDC118 that corresponds to maximum sensitivity is 50.Math.10.sup.12 C. ADC bit depth is 20 (n.sub.tot=10.sup.6), therefore an ADC step has a noise of

[00005]$\begin{array}{cc}{Q}_{\mathrm{ADC}}=\frac{Q_{\mathrm{tot}}}{n_{\mathrm{tot}}}=50.Math.{10}^{-18}.Math..Math.C,& \left(6\right)\end{array}$

[0047] and therefore, the circuit noise, in ADC steps, is

[00006]$\begin{array}{cc}N=\frac{Q_{\mathrm{noise}}}{Q_{\mathrm{ADC}}}=45.Math..Math.\mathrm{quants}.& \left(7\right)\end{array}$

[0048] Empirical tests of the proposed schematic with a supplemental circuit including a low-noise operational amplifier AD8656 showed that total noise of the demodulation system is less than 32 ADC steps, which is close to the target value.

[0049] An article titled A low noise multi-channel readout IC for X-ray cargo inspection (published in Journal semiconductors, April, 2013, Vol. 34, #4 P045011-1-P045011-6) describes a schematic similar to FIG. 1, and lists the results of its analysis. The expressions and formulas from this article can be used to calculate noises generated by employing a scintillator, a photodiode, an integrator, and an ADC. The results are as follows:

[0050] Total noise of the integration cascade is

[00007]$\begin{array}{cc}\stackrel{\_}{V_{\mathrm{pre\_sample},\mathrm{tot}}^2}{\stackrel{\_}{V_{\mathrm{pd\_int},\mathrm{tot}}^2}\left(\frac{C_{\mathrm{pd}}}{C_f}\right)}^2+\stackrel{\_}{V_{\mathrm{pre\_int},\mathrm{hold}}^2}.& \left(8\right)\end{array}$

[0051] The first addendphotodiode noise V.sub.pd.sub._.sub.int,tot.sup.2is defined as follows:

[00008]$\begin{array}{cc}\stackrel{\_}{V_{\mathrm{pd\_int},\mathrm{tot}}^2}=\stackrel{\_}{V_{\mathrm{pd\_int},\mathrm{amp}}^2}+\stackrel{\_}{V_{\mathrm{pd\_int},\mathrm{hold}}^2},.Math.\mathrm{where}& \left(9\right)\\ \stackrel{\_}{V_{\mathrm{pd\_int},\mathrm{amp}}^2}\frac{4}{3}.Math..Math.\frac{\mathrm{kT}}{C_c}.Math.\frac{C_f}{C_{\mathrm{pa}}+C_f+C_{\mathrm{pd}}},& \left(10\right)\\ \stackrel{\_}{V_{\mathrm{pd\_int},\mathrm{hold}}^2}\frac{\mathrm{kT}}{C_c}.Math.\frac{C_f}{C_{\mathrm{pa}}+C_f+C_{\mathrm{pd}}}.Math.\left(g_m.Math.R_{\mathrm{hold}}+\frac{C_c}{C_{\mathrm{pd}}}.Math.\frac{C_{\mathrm{pa}}+C_f}{C_f}\right),& \left(11\right)\end{array}$

[0052] where =2.1 is correction coefficient; k=1.38.Math.10.sup.23 J/K is Boltzmann constant; T=300 K; C.sub.pd=440 pF is photodiode capacitance; C.sub.f=12.5 pF is integrator feedback capacitance; C.sub.pa=2.1 pF is amplifier's input capacitance; C.sub.c=128 pF is capacitance added to the amplifier for its stable operation; g.sub.m=1271 ; R.sub.hold=9 k is integrator key resistance.

[0053] Meanwhile, amplifier noise V.sub.pre.sub._.sub.int,hold.sup.2 is

[00009]$\begin{array}{cc}\stackrel{\_}{V_{\mathrm{pd\_int},\mathrm{tot}}^2}=\stackrel{\_}{V_{\mathrm{pd\_int},\mathrm{amp}}^2}+\stackrel{\_}{V_{\mathrm{pd\_int},\mathrm{hold}}^2},.Math.\mathrm{where}& \left(12\right)\\ \stackrel{\_}{V_{\mathrm{pd\_int},\mathrm{amp}}^2}\frac{4}{3}.Math..Math.\frac{\mathrm{kT}}{C_c}.Math.\frac{C_{\mathrm{pa}}+C_f+C_{\mathrm{pd}}}{C_f},& \left(13\right)\\ \stackrel{\_}{V_{\mathrm{pd\_int},\mathrm{hold}}^2}\frac{\mathrm{kT}}{C_c}.Math.\frac{C_f}{C_{\mathrm{pa}}+C_f+C_{\mathrm{pd}}}.Math.g_m.Math.{R_{\mathrm{hold}}\left(\frac{C_{\mathrm{pd}}}{C_f}\right)}^2,& \left(14\right)\end{array}$

[0054] where total noise is defined by equation 8.

[0055] By adding a supplemental circuit between a photodiode and an integrator (as shown in FIG. 2 and FIG. 3), it is possible to remove the influence of photodiode capacitance on the integrator operation. In this case, one may calculate the noise of the analogous schematic when a photodiode with a capacitance of 440 pF is added to the integrator's input and compare it with the noise in case there is no such capacitance at the integrator's input, only an input capacitance of the operational amplifier and a stray capacitance of the board bearing the supplemental circuit of the present invention.

[0056] For instance, let total capacitance at the integrator's input be 10 pF, then, using expressions (8)-(14) and the values of both capacitances at the integrator's input (440 pF and 10 pF respectively), it can be calculated that the noise of the analogous schematic would decrease by a factor of 7.3, if the supplemental circuit were added.

[0057] Also, the supplemental circuit amplifies the photodiode signal with a factor of up to K=R.sub.1/(R.sub.2+R.sub.3) at direct current.

[0058] The schematic was modelled using MicroCap8 software that has shown that when a low-noise amplifier AD8656, a feedback resistor R1 (313)=5600 K, its shunting capacitance C.sub.1 (314)=22 pF, R2 (315)=100 K, R3 (317)=100 K, C.sub.2 (316)=220 pF, C.sub.3 (318)=1200 pF provides a factor of 8.1 amplification of supplemental circuit, where the betatron generates an impulse with a duration of 2 s.

[0059] Thus, by adding a supplemental circuit, as disclosed in the present invention, it is possible to significantly improve the system sensitivity, increase signal-to-noise ratio, significantly reduce the influence of photodiode capacitance on the total noise of the system and reduce the influence of temperature fluctuations on the system operation, thanks to a blocking capacitor C.sub.3 (318)=1200 pF. This capacitor also removes slight exposures, which are possible in actual implementation.

[0060] The multi-channel system for truck scanning with an impulse radiation source of the present invention was developed and implemented without photodiodes; its noise was around 5-7 steps of a 20-bit ADC DDC118. When photodiodes were added, noise increased to 31-32 ADC quants, wherein R.sub.1=5600 K, C.sub.1=22 pF, R.sub.2=R.sub.3=100 K, C.sub.2=220 pF, C.sub.3=1200 pF. When R.sub.2=R.sub.3 was increased to 510 K, C.sub.2 was reduced to 51 pF, and C.sub.3 to 240 pF, noise decreased to 7-9, though system sensitivity also decreased. In order to use the full dynamic range of the circuit, the betatron has to be replaced with a more powerful radiation source, i.e., a linatron.

[0061] Experiments conducted to compare the conventional detector and the detector of the present invention, using a betatron impulse source of the same energy in both cases, show the superiority of the inventive photodector. FIG. 4 shows the conventional detector, which detects less than 200000 radiation quanta, with a noise of 40 units. The inventive photodetector circuit, as shown in FIG. 5, gives over 800000 radiation quanta, with a noise of 30 units.

[0062] Having thus described a preferred embodiment, it should be apparent to those skilled in the art that certain advantages of the described method and apparatus have been achieved.

[0063] It should also be appreciated that various modifications, adaptations, and alternative embodiments thereof may be made within the scope and spirit of the present invention. The invention is further defined by the following claims.