Systems and methods are disclosed to analyze sediment and sedimentary rock properties. Example systems and methods transform data representing physical particles and burial histories into a three-dimensional representation of solids and pores in sediments and sedimentary rocks by analyzing effects of deposition, grain rearrangement, compaction, and chemical reactions. Resulting output may include three-dimensional representations which may be the basis of physical objects or media for laboratory tests. In an example, output may provide a basis for evaluating present-day properties for areas where sample material is unavailable, reconstructing properties for times in the geologic past, and forecasting the effects of engineering and industrial activities on properties.

Methods for using a single electron microscope system for investigating a sample with twin electron beams having different focal lengths include the steps of emitting electrons toward the sample, forming the electrons into a two beams, and then modifying the focal properties of at least one of the two beams such that they have different focal planes. Once the two beams have different focal planes, the first electron beam is focused at the sample, and the second electron beam is focused so that it acts as a TEM beam that is parallel beam when incident on the sample. Emissions resultant from the first electron beam and the TEM beam being incident on the sample can then be detected by a single detector or detector array and used to generate a TEM image.

A method of inspecting and forming sapphire structures. The method of inspecting a sapphire structure may include providing an annealed sapphire structure, and measuring a profile of at least a portion of the annealed sapphire structure. The profile of at least the portion of the annealed sapphire structure may be measured using a non-x-ray based measuring device. Additionally, the method of inspecting may include identifying a defect within at least a portion of the measured profile of the annealed sapphire structure.

Methods for using a single electron microscope system for investigating a sample with twin electron beams having different focal lengths include the steps of emitting electrons toward the sample, forming the electrons into a two beams, and then modifying the focal properties of at least one of the two beams such that they have different focal planes. Once the two beams have different focal planes, the first electron beam is focused at the sample, and the second electron beam is focused so that it acts as a TEM beam that is parallel beam when incident on the sample. Emissions resultant from the first electron beam and the TEM beam being incident on the sample can then be detected by a single detector or detector array and used to generate a TEM image.

Methods for using a single electron microscope system for investigating a sample with twin electron beams having different focal lengths include the steps of emitting electrons toward the sample, forming the electrons into a two beams, and then modifying the focal properties of at least one of the two beams such that they have different focal planes. Once the two beams have different focal planes, the first electron beam is focused at the sample, and the second electron beam is focused so that it acts as a TEM beam that is parallel beam when incident on the sample. Emissions resultant from the first electron beam and the TEM beam being incident on the sample can then be detected by a single detector or detector array and used to generate a TEM image.

Disclosed is a gradient boosting decision tree (GBDT) prediction method for sandstone drillability based on crystal structure and mineralogical characteristics, including: acquiring cuttings samples of an area to be tested, dividing crystal boundaries based on the cuttings sample, and acquiring a plurality of crystal samples; numbering the plurality of the crystal samples, and extracting geometric parameters and mineral components of the plurality of the crystal samples; performing a correlation analysis on the geometric parameters, the mineral components and drillability data to obtain geometric parameters, the mineral components and the drillability; dividing the geometric parameters, the mineral components and the drillability into a training set and a testing set; training a GBDT model through the training set to obtain a trained GBDT model; and detecting accuracy of the trained GBDT model through the testing set to obtain prediction accuracy of trained GBDT model.

In a case that a Bragg angle corresponding to the crystal lattice plane is referred to as , making an X-ray incident on the sample at a first incident angle @1 of or more and + or less, measuring 1 or 2 peak positions of by measuring a diffracted X-ray intensity while rotating the sample in-plane with the as a central axis, making an X-ray incident on the sample at a second incident angle .sub.2 of or more and + or less different from a first incident angle .sub.1, measuring 1 or 2 peak positions of by measuring a diffracted X-ray intensity while rotating the sample in-plane with the as a central axis, and calculating the from the .sub.1, the .sub.2 and the peak positions of the obtained by the measurement.

A sensor apparatus for determining and/or monitoring a process variable of a medium in a containment includes: a crystal body including at least one defect; a magnetic field system for producing a magnetic field in the region of the crystal body and in the region of the medium within the containment, wherein the crystal body and the magnetic field system are arrangeable from the outside at a wall of the containment; a detection unit for detecting a magnetic field-dependent, fluorescent signal from the crystal body, wherein the detection unit has an excitation unit for optical exciting of the defect and a detector for detecting the fluorescent signal; and an evaluation unit for ascertaining at least one piece of information concerning the process variable based on the fluorescent signal.

A porous coordination network is represented by the following formulas (I) to (VIII), in which M.sup.2+ is a divalent metal ion, M.sup.3+ is a trivalent metal ion, L1a and L1b are tridentate ligands having hexaazaphenalenyl, L2a and L2b are bidentate or tridentate ligands containing a carboxy group, L3.sup. is a tertiary ligand ion that is an anion of triazole or a triazole derivative, and Y is a cation.

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