Patent classifications
G01B11/2545
Handheld three-dimensional coordinate measuring device operatively coupled to a mobile computing device
A handheld device has a projector that projects a pattern of light onto an object, a first camera that captures the projected pattern of light in first images, a second camera that captures the projected pattern of light in second images, a registration camera that captures a succession of third images, one or more processors that determines three-dimensional (3D) coordinates of points on the object based at least in part on the projected pattern, the first images, and the second images, the one or more processors being further operable to register the determined 3D coordinates based at least in part on common features extracted from the succession of third images, and a mobile computing device operably connected to the handheld device and cooperating with the one or more processors, the mobile computing device operable to display the registered 3D coordinates of points.
Sensing on UAVs for mapping and obstacle avoidance
Structured light approaches utilize a laser to project features, which are then captured with a camera. By knowing the disparity between the laser emitter and the camera, the system can triangulate to find the range. Four, 185 degree field-of-view cameras provide overlapping views over nearly the whole unit sphere. The cameras are separated from each other to provide parallax. A near-infrared laser projection unit sends light out into the environment, which is reflected and viewed by the cameras. The laser projection system will create vertical lines, while the cameras will be displaced from each other horizontally. This relative shift of the lines, as viewed by different cameras, enables the lines to be triangulated in 3D space. At each point in time, a vertical stripe of the world will be triangulated. Over time, the laser line will be rotated over all yaw angles to provide full a 360 degree range.
COMPENSATION OF THREE-DIMENSIONAL MEASURING INSTRUMENT HAVING AN AUTOFOCUS CAMERA
A three-dimensional (3D) measuring instrument includes a registration camera and a surface measuring system having a projector and an autofocus camera. For the instrument in a first pose, the registration camera captures a first registration image of first registration points. The autofocus camera captures a first surface image of first light projected onto the object by the projector and determines first 3D coordinates of points on the object. For the instrument in a second pose, the registration camera captures a second registration image of second registration points. The autofocus camera adjusts the autofocus mechanism and captures a second surface image of second light projected by the projector. A compensation parameter is determined based at least in part on the first registration image, the second registration image, the first 3D coordinates, the second surface image, and the projected second light.
Multi-line laser three-dimensional imaging method and system based on random lattice
The multi-line laser three-dimensional imaging method and system is based on a random lattice. A multi-line laser is used and combined with a rotating mechanism to realize a large-view-field rapid scanning effect, such that the working efficiency is improved by orders of magnitude, and the deployment difficulty of the system is reduced. Due to the fact that within an imaging range, pattern features of the random lattice of each local area have uniqueness, a plurality of laser lines are extracted, position sequence numbers are distinguished, and noise points are reduced through mutual verification of the pattern features of the random lattice between adjacent images, such that the quality of three-dimensional point cloud data is greatly improved. The method and the system can be applied to industrial applications, such as disorderly grabbing, feeding and discharging, unstacking and stacking, logistics sorting and the like.
Process abnormality detection system for three-dimensional additive manufacturing device, three-dimensional additive manufacturing device, process abnormality detection method for three-dimensional additive manufacturing device, method for manufacturing three-dimensional additive manufactured product, and three-dimensional additive manufactured product
A process abnormality detection system for a three-dimensional additive manufacturing device which performs additive modeling by emitting a beam to a powder bed determines that a laying abnormality of the powder bed is occurring if at least one of a first condition that an average height of the powder bed from a reference position is out of a first predetermined range or a second condition that a height variation of the powder bed is out of a second predetermined range is satisfied, on the basis of a detection result of a shape measurement sensor.
Reflective Coating for Material Calibration
A method includes generating correction data for a construction material that is used by an additive-manufacturing machine to manufacture an object. This correction data compensates for an interaction of the construction material with first radiation that has been used to illuminate the construction material.
MULTI-LINE LASER THREE-DIMENSIONAL IMAGING METHOD AND SYSTEM BASED ON RANDOM LATTICE
The multi-line laser three-dimensional imaging method and system is based on a random lattice. A multi-line laser is used and combined with a rotating mechanism to realize a large-view-field rapid scanning effect, such that the working efficiency is improved by orders of magnitude, and the deployment difficulty of the system is reduced. Due to the fact that within an imaging range, pattern features of the random lattice of each local area have uniqueness, a plurality of laser lines are extracted, position sequence numbers are distinguished, and noise points are reduced through mutual verification of the pattern features of the random lattice between adjacent images, such that the quality of three-dimensional point cloud data is greatly improved. The method and the system can be applied to industrial applications, such as disorderly grabbing, feeding and discharging, unstacking and stacking, logistics sorting and the like.
MEASUREMENT OF THICKNESS OF THERMAL BARRIER COATINGS USING 3D IMAGING AND SURFACE SUBTRACTION METHODS FOR OBJECTS WITH COMPLEX GEOMETRIES
Embodiments described herein relate to a non-destructive measurement device measurement device and a non-destructive measurement method for determining coating thickness of a three-dimensional (3D) object. In one embodiment, at least one first 3D image of an uncoated surface of the object and at least one second 3D image of a coated surface of the object are collected and analyzed to the determine the coating thickness of the object.
THREE-DIMENSIONAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL MEASUREMENT METHOD
A three-dimensional measurement system capable of realizing high-speed processing while increasing measurement resolution are provided. The system includes: an image capture unit including a first and second image capture units that are spaced apart; a first calculation unit calculates a parallax at first feature points in the images using distance information of a three-dimensional measurement method other than a stereo camera method or information for calculating a distance, using at least one of the first and second image capture units; and a second calculation unit calculates a parallax at second feature points based on a corresponding point for the second feature point by using the stereo camera method using the first and second image capture units, and specifies a three-dimensional shape based on the parallax at the first and second feature points. The second calculation unit sets a search area based on the parallax at the first feature points.
STRUCTURED LIGHT PROJECTION THROUGH THE MINIMIZATION OF VISUAL ARTIFACTS BY WAY OF DELIBERATELY INTRODUCED OPTICAL ABERRATIONS
A triangulation device for measuring a measurement object by a projection of a structured light pattern onto the measurement object. The triangulation device includes a projector projecting the structured light pattern decomposable into different spatial frequencies onto the measurement object. The projector comprises a matrix of pixel elements and a lens system which determines a wavefront with a wavefront aberration from a reference wavefront, and a camera including a lens system and an imaging sensor, the camera being configured to receive the structured light pattern projected by the projector onto the measurement object, and a processing unit configured to provide distance information by evaluating imaging information provided by the camera. The wavefront aberration comprises a primary spherical aberration coefficient Z.sub.9, wherein the primary spherical aberration coefficient Z.sub.9 is larger than 0.5λ, wherein λ is a wavelength of the projected structured light pattern.