An image capture device assembly includes a light source that emits a reference light pattern, an image capture device, and a control device that controls the light source and the image capture device. The light source emits the reference light pattern to a subject with high brightness and low brightness, respectively, under the control of the control device. The image capture device captures an image of the reference light pattern and the subject in a high brightness irradiation state and outputs a first image signal to the control device. The image capture device captures an image of at least the subject in a low brightness irradiation state and outputs a second image signal to the control device. The control device generates a reference light pattern image signal from a difference between the first image signal and the second image signal.

An imaging apparatus includes a circuitry configured to perform depth analysis of a scene by time-of-flight imaging and to perform motion analysis in the scene by structured light imaging, wherein identical sensor data is used for both, the depth analysis and the motion analysis.

According to an aspect, there is provided a method comprising controlling a structural light source of a modelling arrangement to produce a diffraction pattern of a known geometry on a surface to be modeled, the diffraction pattern accurately complying with a mathematical-physical model and wherein beam output angles of the diffraction pattern are accurately known based on the mathematical-physical model; recording a first image of the surface comprising the diffraction pattern with a first camera and a second image of the surface comprising the diffraction pattern with a second camera substantially simultaneously; determining a point cloud comprising primary points from the diffraction pattern visible in the first image; identifying the corresponding primary points from the second image; and using each primary point of the point cloud in the first and second images as an initial point for search spaces for secondary points in the first and second images.

A camera device for a vehicle for 3-D environment sensing includes at least two camera modules having at least partly overlapping sensing ranges, a camera control unit, an evaluation unit and a point light projector. The point light projector is arranged and configured in such a way that the point light projector projects a light pattern of measurement points into the vehicle environment. The at least two camera modules are arranged and configured in such a way that at least part of the projected light pattern is imaged in the overlapping sensing range. The evaluation unit is configured to determine the 3-D position of measurement points in the vehicle environment from image data captured with the at least two camera modules. The point light projector is configured to produce a series of “pseudo-noise patterns” as the light pattern, the “pseudo-noise patterns” being projected into the vehicle environment in temporal succession.

Provided is a structured light projector including a light source configured to emit light, and a nanostructure array configured to form a dot pattern based on the light emitted by the light source, the nanostructure array including a plurality of super cells each respectively including a plurality of nanostructures, wherein each of the plurality of super cells includes a first sub cell that includes a plurality of first nanostructures having a first shape distribution and a second sub cell that includes a plurality of second nanostructures having a second shape distribution.

A handheld wand comprises a probe at a distal end of the elongate handheld wand. The probe includes a light projector and a light field camera. The light projector includes a light source and a pattern generator configured to generate a light pattern. The light field camera includes a light field camera sensor, the light field camera sensor comprising an image sensor comprising an array of sensor pixels, and an array of micro-lenses disposed in front of the image sensor such that each micro-lens is disposed over a sub-array of the array of sensor pixels.

One embodiment can provide a machine-vision system. The machine-vision system can include a structured-light projector, a first camera positioned on a first side of the structured-light projector, and a second camera positioned on a second side of the structured-light projector. The first and second cameras are configured to capture images under illumination of the structured-light projector. The structured-light projector can include a laser-based light source.

A method includes generating correction data for a construction material that is used by an additive-manufacturing machine to manufacture an object. This correction data compensates for an interaction of the construction material with first radiation that has been used to illuminate the construction material.

A three-dimensional geometry measurement apparatus including a virtual coordinate identification part that identifies coordinates of a virtual captured pixel corresponding to a feature point in an image plane of a capturing device by virtually projecting the feature point on a reference instrument onto the image plane: correction part that generates correction information for correcting coordinates of the measurement-target captured pixel included in a measurement-target captured image; and a geometry identification part that corrects coordinates of a plurality of the measurement-target captured pixels included in the measurement-target captured image generated by capturing an object to be measured with the capturing device on the basis of geometric property information and the correction information, and identifies a geometry of the object to be measured on the basis of measurement three-dimensional coordinates to be calculated based on the coordinates of the measurement-target captured pixels.

The invention discloses a method for obtaining the geometrical and mechanical parameters of rock samples and a holographic scanning system thereof, wherein the system includes an observation mechanism, a multi-scale penetration mechanism, a grinding mechanism, a rock sample installation mechanism arranged on a three-axis precision motion platform, and an industrial computer controlling the operation mode of each mechanism of the platform Indentation/rotary penetration test, pulse echo signal acquisition, three-dimensional surface topography reconstruction, layer by layer grinding and repeated experiments are carried out. The geometric parameters and corresponding mechanical field parameters are obtained by spatial interpolation of the three-dimensional parameter lattice accumulated by several layers of single-layer rock parameters. The holographic scanning system and method can obtain the real spatial distribution of various media in rock samples. Combined with high performance numerical calculation method, it provides a more scientific method for the analysis of rock mechanical properties, failure and instability.