A scanning system for the 3D measurement of a surface of an object includes a 3D scanner and a computing system. The 3D scanner includes a scanner frame, a set of imaging modules and a communication module. The imaging modules include a light projector unit for projecting a structured light pattern onto the surface of the object, at least one camera for capturing image data, and at least one image data compression module that compresses the image data using a nonlinear conversion that compresses a dynamic range of intensity values in the compressed image data such that lower intensity values are amplified and mapped to a larger portion of the compressed dynamic range while amplification of higher intensity values is limited. The computing system controls an exposure setting of the 3D scanner based on background intensity values for images in the compressed image data. Related methods are also described.

Systems and techniques are described herein for improved feature correlation. For instance, an apparatus for improved featured correlation is provided. The method may include a projector configured to project a pattern into a scene for feature correlation by an imaging device that captures images of the pattern as projected into the scene; wherein the apparatus is separate from the imaging device.

Provided is an image projection system including an image projection unit that irradiates a physical object with image laser light for forming pixels of an image to be projected on the physical object, a reference light irradiation unit that irradiates the physical object with reference laser light emitted through an emission port common to the image laser light, and a shape measurement unit that detects, at a position circumscribing the emission port, the reference laser light reflected from the physical object and measures a three-dimensional shape of the physical object on the basis of a result of the detection.

A topographical inspection device that employs one or both of a photometric stereo system for determining surface normal for individual pixel locations in an image space and/or dot pattern projection. A device body supports light elements at spaced apart locations to illuminate an inspection region and a dot pattern projector for projecting a dot pattern onto the inspection region. A camera captures images of the surface when illuminated by the light elements and/or dot pattern projector. Controlling the light elements and camera, a first topographical measurement of the inspection region is made based on light intensity in images taken by the camera. A second topographical measurement may be made based on dot pattern projection.

An image processing device which compensates for a stereoscopic effect of a stereoscopic image, the image processing device including: an obtaining unit which obtains a left-eye image and a right-eye image which are included in the stereoscopic image; a recognition image generating unit which generates a recognition image corresponding to the stereoscopic image by applying a pattern to a virtual stereoscopic structure generated based on a depth represented in the stereoscopic image; a right/left recognition image generating unit which generates, from the recognition image, a right-eye recognition image and a left-eye recognition image according to a disparity of the stereoscopic image for stereoscopically viewing the recognition image; and an image combining unit which combines the right-eye recognition image with the right-eye image obtained by the obtaining unit and combines the left-eye recognition image with the left-eye image obtained by the obtaining unit.

A solution including a noncontact electronic measurement device is provided. The measurement device includes one or more imaging devices configured to acquire image data of a surface of an object located in a measurement region relative to the measurement device and one or more projected pattern generators configured to generate divergent pattern(s) of structured light, which impact the surface of the object within a field of view of the imaging device when the object is located in the measurement region. Using image data acquired by the imaging device(s), a computer system can measure a set of attributes of the surface of the object and/or automatically determine whether the measurement device is within the measurement region. An embodiment is configured to be held by a human user during operation.

[Object] To propose an image processing device and an image processing method capable of obtaining a pattern-irradiated infrared image and a pattern-irradiation-free infrared image to obtain more accurate depth information by controlling an infrared pattern irradiation timing.

[Solution] Provided is an image processing device including: a pattern irradiation unit that irradiates an infrared pattern onto a surface of a target object; and an infrared image capturing unit that captures an infrared image. The pattern irradiation unit performs irradiation at a predetermined timing corresponding to an infrared image capturing unit's image capturing timing. The infrared image capturing unit obtains a pattern-projected infrared image in which the pattern irradiated by the pattern irradiation unit is projected on the target object, and a pattern-free infrared image in which the pattern is not projected on the target object.

An electronic device (100) includes a depth sensor (120), a first imaging camera (114, 116), and a controller (802). The depth sensor (120) includes a modulated light projector (119) to project a modulated light pattern (500). The first imaging camera (114, 116) is to capture at least a reflection of the modulated light pattern (500). The controller (802) is to selectively modify (1004) at least one of a frequency, an intensity, and a duration of projections of the modulated light pattern by the modulated light projector responsive to at least one trigger event (1002). The trigger event can include, for example, a change (1092) in ambient light incident on the electronic device, detection (1094) of motion of the electronic device, or a determination (1096) that the electronic device has encountered a previously-unencountered environment.

Aspects of the subject disclosure are directed towards safely projecting a diffracted light pattern, such as in an infrared laser-based projection/illumination system. Non-diffracted (zero-order) light is refracted once to diffuse (defocus) the non-diffracted light to an eye safe level. Diffracted (non-zero-order) light is aberrated twice, e.g., once as part of diffraction by a diffracting optical element encoded with a Fresnel lens (which does not aberrate the non-diffracted light), and another time to cancel out the other aberration; the two aberrations may occur in either order. Various alternatives include upstream and downstream positioning of the diffracting optical element relative to a refractive optical element, and/or refraction via positive and negative lenses.

A three-dimensional measurement apparatus includes an attachment portion for attaching the three-dimensional measurement apparatus to a robot, a flange for attaching an end effector, a sensor configured to receive light from an object, and a calculation unit configured to determine three-dimensional information about the object by performing a calculation using data obtained by the sensor. A shortest distance among distances from a center of the flange to an outer peripheral edge of the calculation unit is less than or equal to a radius of the attachment portion or the flange, as viewed from the flange.