G01R1/0416

DEVICE FOR TESTING AT LEAST ONE PLUG-IN ELEMENT
20230087704 · 2023-03-23 ·

A device for testing at least one plug-in element includes a plug-in element receptacle and a test element receptacle, which are adapted to be movable along a test axis for establishing a plug-in connection. A force sensor is configured and disposed to detect a force along the test axis when the plug-in connection is established. A compensating element is configured and disposed for compensating for an offset between the plug-in element and a test element. The compensating element is configured to be at least partially elastic so that the test element is elastically movable to compensate for alignment deviations from the test axis. A method for testing at least one plug-in element is provided along with a method for producing the compensating element.

Exchangeable extended life connections for mass interconnects

An interface having a frame with a plurality of slots, a first pass-through insert in the frame and a second pass-through insert in the frame. The first pass-through insert and the second pass-through insert each have a housing and a contact with the type of contact in the first pass-through insert is different than the type of contact in the second pass-through housing.

Test apparatus for semiconductor package
11609244 · 2023-03-21 · ·

The present disclosure discloses a test apparatus for testing a package-on-package (POP) type semiconductor package includes a lower socket mounted to a tester board providing a test signal, and provided with a plurality of socket pins connected to a lower terminal of a lower package to electrically connect the lower package and the tester board to each other; a pusher to which an upper package is coupled, the pusher having a pusher body which may be moved to approach the lower socket or to be moved away from the lower socket; and an upper socket coupled to the pusher body, and provided with an insulating pad formed of a nonelastic insulating material and a plurality of electrically-conductive parts supported on the insulating pad, the electrically-conductive part being formed of an elastic insulating material containing a plurality of electrically-conductive particles.

Reduced footprint SSD with test station for an underground pipeline

A pipeline AC mitigation SSD Marker Station has a shape and land surface area footprint that are similar to conventional pipeline location markers or corrosion test stations. The SSD Marker Station includes an SSD device that connects an underground metallic pipeline to an underground grounding conductor. The SSD Marker Station further includes a disconnect switch configured to disconnect the SSD device from the pipeline and/or grounding conductor. Also included is a pair of testing ports that are in electrical communication with the SSD device. Testing of the SSD device thereby requires only operating the disconnect switch to isolate the SSD device from the pipeline and/or grounding connector and performing an electrical measurement across the testing ports. In embodiments, the SSD Marker Station meets all requirements applicable to a pipeline location marker, and can be installed in lieu of a pipeline location marker.

PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR
20220326278 · 2022-10-13 ·

An apparatus has at least substrate having at least two conductive paths, a least two connectors positioned in a first plane, and a movable stage connected to one of the at least one substrate to move the one substrate perpendicular to the first plane form an electrically conductive path between two of the at least two connectors.

Managing grid interaction with interconnect socket adapter configured for an energy storage device

A system for managing grid interaction with an energy storage device includes an energy exchange server, a plurality of energy storage devices, a plurality of interconnect socket adapters, and a plurality of energy exchange controllers, each energy exchange controller coupling to one of the plurality of interconnect socket adapters and dictating energy consumption based on energy pricing data received from the energy exchange server. Each interconnect socket adapter electrically couples to the power grid, one or more energy sinks, and an energy storage device, and the energy exchange server receives a real-time energy consumption data set, a real-time energy production data set, a set of environmental parameters and a starting energy price, and generates a current aggregate electricity demand value as a function of the real-time energy consumption data set and the environmental parameters, a current aggregate electricity supply value as a function of the real-time energy production dataset and the environmental parameters, and a current energy price as a function of the starting energy price, the current aggregate electricity demand value, and the current aggregate electricity supply value.

Socket Based Disconnect with Surge Protection
20220334157 · 2022-10-20 ·

An intermediate disconnect section (100) for mounting on a meter base (10) and an electricity meter (20). A first source coupling (117) mounted on a platform (106) is electrically couplable to a source connector of the meter base (10). A second source coupling (119) is electrically coupled to a source connection of the electricity meter (120). A first load coupling (121) is electrically coupled to a load connector of the meter base (10). A second load coupling (123) electrically coupled to a load connection of the electricity meter (20) and to the first load coupling (121). A switch (110) couples and decouples the first source coupling (117) to and from the second source coupling (119). A switching mechanism (130) opens and closes the switch (110) and includes an external device (138) that allows a user to open and close the switch (110) manually.

Inspecting device and its testing socket

A testing socket includes a metal block, an assembly block, an analog ground probe pin and a digital ground probe pin. The metal block is formed with a concave portion and used to connect to an independent main ground. The assembly block is electrically isolated from the metal block, and detachably embedded in the recess, so that the metal block and the assembly block are assembled together to be a probe holder. The digital grounding probe is inserted in the metal block, electrically connected to the independent main ground through the metal block. The digital ground probe pin can be electrically connected to a device to be tested (DUT) and the independent main ground. The analog ground probe pin is inserted in the assembly block, and electrically connected to the DUT and another independent main ground.

TESTING DEVICE AND METHOD FOR TESTING DEVICES UNDER TEST
20230104095 · 2023-04-06 ·

A testing device includes a power supply and a plurality of testing ports. The testing ports are electrically connected to the power supply. Each of the testing ports includes a contact and a current clamper. The contact is configured to electrically couple a device under test (DUT). The current clamper is connected between the power supply and the contact and configured to allow a limited current having a predetermined current value to flow to the contact.

Test system and signal transmission circuit board thereof

A signal transmission circuit board includes a main body and a first connecting unit connected with the main body. The first connecting unit includes a test pin area and an avoidance area adjacent to the test pin area, and the avoidance area is free of test pins.